Control charts are the most important tools of statistical process control used to discriminate between assignable and common causes of variation and to improve the quality of a process. To design a control chart, three parameters including sample size, sampling interval, and control limits should be determined. The objectives are hourly expected cost, in-control average run length, power of th...

Water pH and active ingredient concentration are two of the most important variables to consider in the manufacturing process of fungicides. If these variables do not meet the required standards, the quality of the product may be compromised and lead to poor fungicide performance when water is used as the application carrier, which is in most cases. Given the correlation between the variable...

In many processes in real practice at the start-up stages the process parameters are not known a priori and there are no initial samples or data for executing Phase I monitoring and estimating the process parameters. In addition, the practitioners are interested in using one control chart instead of two or more for monitoring location and variability of processes. In this paper, we consider a s...

Multivariate control charts such as Hotelling`s T^ 2 and X^ 2 are commonly used for monitoring several related quality characteristics. These control charts use correlation structure that exists between quality characteristics in an attempt to improve monitoring. The purpose of this article is to discuss some issues related to the G chart proposed by Levinson et al. [9] for detecting shifts in ...

Multivariate statistical process control deserves particular attention in the recent scenario. Though, Hotelling control chart is quite popular and widely used technique in this field but its performance is deteriorated when the underlying distribution of the quality characteristics is not following multivariate normal distribution. Hence the need of developing a non-parametric multivariate con...

in this research, an iterative approach is employed to recognize and classify control chart patterns. to do this, by taking new observations on the quality characteristic under consideration, the maximum likelihood estimator of pattern parameters is first obtained and then the probability of each pattern is determined. then using bayes’ rule, probabilities are updated recursively. finally, when...

C-control chart assumes that process nonconformities follow a Poisson distribution. In actuality, however, this Poisson distribution does not always occur. A process control for semiconductor based on a Poisson distribution always underestimates the true average amount of nonconformities and the process variance. Quality is described more accurately if a compound Poisson process is used for pro...