Submitted for the MAR14 Meeting of The American Physical Society Plasmons and Electrons as Nanosecond-Fast Sensors for Scanning Tunneling Microscopy SEBASTIAN LOTH, Max Planck Institute for the Structure and Dynamics of Matter, Hamburg, Germany — The ability to measure the fast dynamical evolution of atomic-scale systems often holds the key to their understanding. We combine fast pump-probe spe...

Since its invention in the early 1980, scanning tunneling microscopy1-4 (STM) and techniques such as atomic force microscopy5 (AFM) that have evolved from it have become tools of paramount importance in fundamental studies of surfaces. In addition, increasing effort has been directed towards the use of STM and related techniques to address problems of technological interest, particularly in the...

scanning hall probe microscopy (shpm) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. this method is based on application of the hall effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  shpm provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

Limits on the effective resolution of many optical near-field experiments are investigated. The results are applicable to variants of total-internal-reflection microscopy (TIRM), photon-scanning-tunneling microscopy (PSTM), and near-field-scanning-optical microscopy (NSOM) in which the sample is weakly scattering and the direction of illumination may be controlled. Analytical expressions for th...

Systematic studies on scanning probe lithography (SPL) methodologies have been performed using self-assembled monolayers (SAMs) on Au as examples. The key to achieving high spatial precision is to keep the tip-surface interactions strong and local. Approaches include three atomic force microscopy (AFM) based methods, nanoshaving, nanografting, and nanopen reader and writer (NPRW), which rely on...