نتایج جستجو برای: optical characterization

تعداد نتایج: 630613  

2017
Shiliang Wang Zhiwei Shan Han Huang

Applications of nanowires into future generation nanodevices require a complete understanding of the mechanical properties of the nanowires. A great research effort has been made in the past two decades to understand the deformation physics and mechanical behaviors of nanowires, and to interpret the discrepancies between experimental measurements and theoretical predictions. This review focused...

K. K. Chattopadhyay P. Datta P.K. Kalita Rh. Saikia,

CdSe nanostructures were synthesized by using green chemical route as starch was used as capping agent. XRD, HR-TEM, SEAD, UV and PL studies were made for structural and optical properties of the prepared sample. Film morphology and the thickness measurement of n-CdSe were carried out with AFM analysis. I-V characteristics curve of this junction confirmed the formation of Schottky contact betwe...

Journal: Journal of Nanoanalysis 2015
Parul Malik Purnima Jain Santosh Singh Sharma Bhasha

Green chemistry is an alternative route of which has overcome the limitations of other chemical methods. Nanocrystalline zinc oxide (NC-ZnO) with different structures have been grown on quartz plates by spin coating method by the use of plant extracts of Citrus aurantifolia which can be a cost effective and eco-friendly approach.. The present exploration describes the synthesis and characteriza...

K. K. Chattopadhyay P. Datta P.K. Kalita Rh. Saikia,

CdSe nanostructures were synthesized by using green chemical route as starch was used as capping agent. XRD, HR-TEM, SEAD, UV and PL studies were made for structural and optical properties of the prepared sample. Film morphology and the thickness measurement of n-CdSe were carried out with AFM analysis. I-V characteristics curve of this junction confirmed the formation of Schottky contact betwe...

Gh. A. Al-Dahash, J. Al-Shahban M. Al-Kinany

We report the growth and characterization of Cu nanoparticles thin film of on glass substrate by pulse laser deposition method. The Cu thin film prepared with different energy 50, 60, 70, and 80 mJ. The energy effect on the morphological, structural and optical properties were studied by AFM, XRD and UV-Visible spectrophotometer. Surface topography studied by atomic force microscopy revealed na...

2013
Steve Yao

Degree of Polarization (DOP) is an important property of light sources. It directly relates to the accuracy of optical component characterization, the sensitivity of sensor systems, and the quality of optical signals in optical communication systems. Therefore, the accurate and fast characterization of DOP is increasingly important. This article first reviews the fundamentals of DOP and summari...

Journal: :international journal of nano dimension 0
rh. saikia department of electronics & communication technology, gauhati university, guwahati-781014, india. p.k. kalita department of physics, guwahati college, guwahati-781021, india. p. datta department of electronics & communication technology, gauhati university, guwahati-781014, india. k. k. chattopadhyay department of physics, jadavpur university, jadavpur-700032, india.

cdse nanostructures were synthesized by using green chemical route as starch was used as capping agent. xrd, hr-tem, sead, uv and pl studies were made for structural and optical properties of the prepared sample. film morphology and the thickness measurement of n-cdse were carried out with afm analysis. i-v characteristics curve of this junction confirmed the formation of schottky contact betwe...

Journal: :Applied optics 2011
Tatiana V Amotchkina Michael K Trubetskov Alexander V Tikhonravov Vesna Janicki Jordi Sancho-Parramon Hrvoje Zorc

In the present study we determine the optical parameters of thin metal-dielectric films using two different characterization techniques based on nonparametric and multiple oscillator models. We consider four series of thin metal-dielectric films produced under various deposition conditions with different optical properties. We compare characterization results obtained by nonparametric and multi...

2001

NBS Special Publication 637, Optical Fiber Characterization [1], is a two-volume compilation of previously published NBS Technical Notes concerning the characterization of optical fibers used for telecommunications. The Technical Notes appeared in the late 1970s and early 1980s, which was the period of commercial infancy of optical telecommunications fiber. During that period, the commercially ...

2017
Istvan Mohacsi Ismo Vartiainen Benedikt Rösner Manuel Guizar-Sicairos Vitaliy A. Guzenko Ian McNulty Robert Winarski Martin V. Holt Christian David

Multi-keV X-ray microscopy has been particularly successful in bridging the resolution gap between optical and electron microscopy. However, resolutions below 20 nm are still considered challenging, as high throughput direct imaging methods are limited by the availability of suitable optical elements. In order to bridge this gap, we present a new type of Fresnel zone plate lenses aimed at the s...

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