نتایج جستجو برای: multiple edge diffraction
تعداد نتایج: 925042 فیلتر نتایج به سال:
Sound reflections from most finite surfaces, such as overhead reflector panels, include a component known as edge diffraction. Edge diffraction is the scattered energy required to maintain a continuous sound field despite the discontinuity in acoustical impedance presented by the scatterer. Edge diffraction can interfere with primary scattered energy to produce comb filtering at receiver locati...
The diffraction of an inhomogeneous plane wave by an impedance wedge embedded in a lossy medium is analyzed. The rigorous integral representation for the field is asymptotically evaluated in the context of the uniform geometrical theory of diffraction (UTD) so that the asymptotic expressions obtained can be employed in a ray analysis of the scattering from more complex edge geometries located i...
This paper deals with the derivation and physical interpretation of a uniform high frequency representation of the Green’s function for a planar phased array of dipoles. The asymptotic representation is based on Floquet wave edge diffraction theory herein extended to accommodate slowly varying tapered amplitude illumination with possible inclusion of dipole amplitudes that tend to zero at the e...
We present a novel methodology for the numerical solution of problems of diffraction by infinitely thin screens in three dimensional space. Our approach relies on new integral formulations as well as associated high-order quadrature rules. The new integral formulations involve weighted versions of the classical integral operators associated with the thin-screen Dirichlet and Neumann problems as...
Calcium fluoride nanoparticles with special amount of cerium ion (%1) were synthesized by coprecipitation. Fourier transforms infrared spectroscopy (FTIR), X-ray diffraction (XRD), absorption and photoluminescence (PL) from CaF2Ce nanoparticles has been investigated. FTIR spectra reveal that there are some amounts of OH, NO3 and other organic functional groups on the parti...
We investigate the impact of line-edge and line-width roughness (LER, LWR) on the measured diffraction intensities in angular resolved extreme ultraviolet (EUV) scatterometry for a periodic line-space structure designed for EUV lithography. LER and LWR with typical amplitudes of a few nanometers were previously neglected in the course of the profile reconstruction. The two-dimensional (2D) rigo...
During investigations of phase transformation kinetics by diffraction techniques, several hundreds or even thousands of diffraction patterns are collected. Automation of the data analysis process is mandatory to perform for example a long sequence of Rietveld refinements. The Bragg edge transmission (BET) technique, a neutron time-of-flight method, allows acquiring patterns of sufficient statis...
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