نتایج جستجو برای: injection temperature

تعداد نتایج: 603224  

Journal: :Progress in neuro-psychopharmacology & biological psychiatry 1990
S C Dilsaver M J Majchrzak

1. Core temperature was telemetrically measured in 15 rats before (i.e., at baseline) and at 10-min intervals for 120 min following the injection of normal saline (1 ml/kg ip) or "no injection." 2. The sample exhibited a mean temperature increase of 0.60 +/- 0.10 degree C (mean +/- SEM) following injection. 3. This differed significantly from the mean increase of 0.13 +/- 0.03 degree C followin...

Journal: :Microelectronics Reliability 2007
Patrick M. Lenahan

The physical and chemical nature of several defects involved in metal–oxide–silicon (MOS) device instabilities have become fairly well understood through studies involving electron paramagnetic resonance (EPR). Recent EPR studies suggest that some of these defects play important roles in the negative bias temperature instability (NBTI). This paper reviews recent NBTI EPR studies as well as earl...

2009
Rachel Capon

Overheating during hot summers is a major risk which will increase under climate change. Thermal dynamic modelling is used to compare the current overheating risk of typical residential properties in the UK with the future overheating risk for the middle decades of this century, i.e. the period 20402069. A wide range of passive and low-energy climate change adaptation measures which could be re...

2016
Baolong Wang Xingru Liu Wenxing Shi Baolong WANG Xingru LIU Wenxing SHI

Heat pumps with rotary compressors operating in low temperature ambient will face heavy performance degradation. A novel vapor injection structure on the blade for the rotary compressor has been proposed in this paper to overcome the back-flowing drawback of the traditional cylinder injection structure and enlarge the injection area. Based on a verified numerical model, the performance of a rot...

Journal: :Microelectronics Reliability 2014
Gunnar Andreas Rott Karina Rott Hans Reisinger Wolfgang Gustin Tibor Grasser

We present measurement results in form of threshold voltage drift plots, recovery traces and continuous capture emission time maps (CET maps) including Negative Bias Temperature Instability (NBTI) and HotCarrier driven Degradation (HCD). The measurements were performed on a 130 nm MOS transistor technology which is used for automotive and analog applications and has a nominal voltage of 1:5 V. ...

2011
EDWIN M. KILBOURNE

Hot weather is an important determinant of human mortality. In the United States, a major heat wave can cause literally thousands of excess deaths in a given summer. Yet, for purposes of public health, the term "heat wave" is not easily defined. "Hot" is a relative term, and periods of hot weather (heat waves) vary greatly in intensity and duration. Ambient temperatures may change rapidly, and ...

2014
W. Zhang P. Khosropanah J. R. Gao T. Bansal T. M. Klapwijk W. Miao S. C. Shi

Journal: :CoRR 2009
Yuriy Shiyanovskii Francis G. Wolff Christos A. Papachristou Daniel J. Weyer W. Clay

This paper discusses the possible introduction of hidden reliability defects during CMOS foundry fabrication processes that may lead to accelerated wearout of the devices. These hidden defects or hardware Trojans can be created by deviation from foundry design rules and processing parameters. The Trojans are produced by exploiting time-based wearing mechanisms (HCI, NBTI, TDDB and EM) and/or co...

2005
HALDUN KUFLUOGLU ASHRAFUL ALAM

Theories of interface trap generation in Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) mechanisms are unified under the geometric interpretation and computational modeling of Reaction-Diffusion (R-D) theoryframework. Analytical derivations that predict the degradation are shown, simulation methodology is explained and numerical solutions are obtained. Time-exponen...

2003
Edward Clarkson

Introduction Budgetary pressures are affecting universities of all kinds: public, private, large and small. Georgia Tech is certainly not immune from this trend, and has been forced to make hard decisions because of its fiscal problems. Despite these difficulties, it is crucial that Georgia Tech and other universities find ways to weather the storm without sacrificing quality of education or ac...

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