The Field Ion Microscope image quality is dependent on operational ? which can be adjusted in order to improve resolution and contrast, he best image operation conditions are discussed with the aim to define them quantitatively. To do so, a JWKB calculation for the ionization distribution is used and a new interpretation of the best image conditions is proposed. An approximate range for the bes...

MARK I. STOCKMAN*, MATTHIAS F. KLING, ULF KLEINEBERG AND FERENC KRAUSZ* Department of Physics and Astronomy, Georgia State University, Atlanta, Georgia 30303, USA Max-Planck-Institut für Quantenoptik, Hans-Kopfermann-Straße 1, D-85748 Garching, Germany Ludwig-Maximilians-Universität München, Department für Physik, Am Coulombwall 1, D-85748 Garching, Germany *e-mail: [email protected]; ferenc.kr...

Field Ion Microscopy (FIM) and Scanning Tunneling Microscopy (STM) have found a wide application in nanotechnology. These microscopes use a metallic nanotip for image acquisition. Resolution of FIM and STM images depends largely on the radius of nanotip apex; the smaller the radius the higher the resolution. In this research, for tungsten nanotip fabrication, electrochemical etching of tungsten...

We are interested in the investigation of cell membrane surface reactions and the pathogen mechanism of the neurodegenerative diseases, based on the molecular science. We are advancing two subjects, aiming the creation and development of new molecular science field, “medical molecular science.” One is the development of ion channel biosensor and its application to the neural network analyzer de...

Imaging and evaporation of atoms in the field ion microscope (FIM) has been modelled by using finite difference methods to calculate the voltage distribution around a tip and hence the electric field strength experienced by individual atoms. Atoms are evaporated based on field strength using a number of different mathematical models which yield broadly similar results. The tip shapes and simula...