The requirement to improve software productivity has promoted the research on software metrics technology. Object Oriented paradigm is the technology being used to build fault free and stupendous softwares; and to make them fault free object oriented metrics are being used. These metrics are used to identify high risk components early in the design phase and hence help us to reduce the rework a...

basins leading to tabriz plain are part of the sub-basins of urmia lake basin, which is located in the east azerbaijan province and in the north-western part of iran. the area of this basin is 5397 km2, and agriculture is one of the main sources of income for the people, which is dependent on groundwater and surface water resources. in this study, an attempt was made to investigate the basins l...

nowadays, water supply for sustainable development is one of the most important concerns and challenges in most countries of the world. due to determination of groundwater potential zones are one of the important tools in the conservation, management and utilization of water resources. thus, the present study aimed to prioritize the effective factors on groundwater potential and its susceptibil...

Software fault count and density prediction Dr. Bob Hughes, Franklyn Young-Martos, Alan Cunliffe Synopsis It has often been found that the majority of faults in a software application are caused by a small number of software components. Previous work on fault distribution has also tended to show that smaller modules often have larger fault densities than ones with more lines of code. Work carri...

Controlling or reducing power consumption during test and reducing test time are conflicting goals. Weighted random patterns (WRP) and transition density patterns (TDP) can be effectively deployed to reduce test length with higher fault coverage in scan-BIST circuits. New test pattern generators (TPG) are proposed to generate weighted random patterns and controlled transition density patterns t...

Weighted random patterns (WRP) and transition density patterns (TDP) can be effectively deployed to optimize test length with higher fault coverage in scan-BIST circuits. New test pattern generators (TPG) are proposed to generate weighted random patterns and controlled transition density patterns to facilitate efficient scan-BIST implementations. We achieve reduction in test application time wi...

Quantum-dot Cellular Automata (QCA) is an emerging and promising technology that provides significant improvements over CMOS. Recently QCA has been advocated as an applicant for implementing reversible circuits. However QCA, like other Nanotechnologies, suffers from a high fault rate. The main purpose of this paper is to develop a fault tolerant model of QCA circuits by redundancy in hardware a...