The basic assumption of the parametric control charts is that underlying process follows specific distribution. appropriateness questionable when different industrial applications do not support this desired assumption. Recently, nonparametric have been introduced to overcome deficiency charts. Nonparametric same in-control run-length characteristics for all continuous distributions and are rob...

The usual practice of using a control chart to monitor a process is to take samples from the process with fixed sampling interval (FSI). In this paper, a synthetic X control chart with the variable sampling interval (VSI) feature is proposed for monitoring changes in the process mean. The VSI synthetic X chart integrates the VSI X chart and the VSI conforming run length (CRL) chart. The propose...

This paper presents the economic design of modified X chart for autocorrelated data and comparison with the economic design of Shewhart’s X chart. An attempt has been made to counter autocorrelation by designing the modified X chart; as the cost of operating a process control system is an important element in the economic design of control charts. The economic designs of both modified and Shewh...

A nonparametric control chart based on a bivariate signed-rank test is developed for monitoring the changes in the location of a bivariate process. The average run length performance of the proposed nonparametric chart is investigated using a simulation study and is compared with a parametric control chart under bivariate normal and bivariate double exponential distributions. Further the perfor...

The design of control charts in statistical quality control addresses the optimal selection of the design parameters such as the sampling frequency and the control limits; and includes sensitivity analysis with respect to system parameters such as the various process parameters and the economic costs of sampling. The advent of more complicated control chart schemes has necessitated the use of M...

For an improved monitoring of process parameters, it is generally desirable to have ef?cient designs of control charting structures. The addition of Shewhart control limits to the cumulative sum (CUSUM) control chart is a simple monitoring scheme sensitive to wide range of mean shifts. To improve the detection ability of the combined Shewhart–CUSUM control chart to off-target processes, we deve...