نتایج جستجو برای: control chart patterns ccps recognition
تعداد نتایج: 1939948 فیلتر نتایج به سال:
Clathrin-mediated endocytosis is a major regulator of cell-surface protein internalization. Clathrin and other proteins assemble into small invaginating structures at the plasma membrane termed clathrin-coated pits (CCPs) that mediate vesicle formation. In addition, epidermal growth factor receptor (EGFR) signaling is regulated by its accumulation within CCPs. Given the diversity of proteins re...
abstract lexical knowledge of complex english words is an important part of language skills and crucial for fluent language use (nation, 2001). the present study, thus, was an attempt to assess the role of morphological decomposition awareness as a vocabulary learning strategy on learners’ productive and receptive recall and recognition of complex english words. so 90 sophomores (female and ma...
The 155-kDa plasma glycoprotein factor H (FH), which consists of 20 complement control protein (CCP) modules, protects self-tissue but not foreign organisms from damage by the complement cascade. Protection is achieved by selective engagement of FH, via CCPs 1-4, CCPs 6-8 and CCPs 19-20, with polyanion-rich host surfaces that bear covalently attached, activation-specific, fragments of complemen...
The first eight and the last two of 20 complement control protein (CCP) modules within complement factor H (fH) encompass binding sites for C3b and polyanionic carbohydrates. These binding sites cooperate self-surface selectively to prevent C3b amplification, thus minimising complement-mediated damage to host. Intervening fH CCPs, apparently devoid of such recognition sites, are proposed to pla...
Control chart pattern recognition has become an active area of research since late 1980s. Much progress has been made, in which there are trends to heighten the performance of artificial neural network (ANN)-based control chart pattern recognition schemes through feature-based and wavelet-denoise input representation techniques, and through modular and integrated recognizer designs. There is al...
On-line automated process analysis is an important area of research since it allows the interfacing of process control with computer integrated manufacturing (CIM) techniques. The inflexibility and high computational costs of traditional SPC pattern recognition methodologies have led researchers to investigate artificial neural network applications to control chart pattern recognition. This pap...
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