نتایج جستجو برای: cause shock failure

تعداد نتایج: 820922  

Journal: :European Journal of Operational Research 2017
Jean-Luc Marichal Pierre Mathonet Jorge Navarro Christian Paroissin

The structure signature of a system made up of n components having continuous and i.i.d. lifetimes was defined in the eighties by Samaniego as the n-tuple whose k-th coordinate is the probability that the k-th component failure causes the system to fail. More recently, a bivariate version of this concept was considered as follows. The joint structure signature of a pair of systems built on a co...

2013
Enrico Zio Piero Baraldi Tiedo Tinga

Preventive maintenance is required to keep critical systems available at reasonable costs. Instead of applying the traditional experience-based approach of statistical analysis of failure data, the present paper proposes to adopt a predictive maintenance policy that relies on detailed knowledge of the physical failure mechanisms. A structured scheme for this approach is presented. Then three ca...

2002
Tin Kam Ho Lawrence C. Cowsar Roland W. Freund Leon Vardapetyan Todd R. Salamon

We describe a simulator for modeling complex control dynamics in optical line systems involving the interaction of multiple transmission, control, and monitoring elements in response to channel changes, component failure, and recovery events.

Journal: :Critical care medicine 2008
Simon Topalian Fredric Ginsberg Joseph E Parrillo

Cardiogenic shock is the most common cause of death in patients hospitalized with acute myocardial infarction and is associated with a poor prognosis. More than 75% of cases are due to extensive left ventricular infarction and ventricular failure. Other causes include right ventricular infarction and papillary muscle rupture with acute severe mitral regurgitation. Activation of neurohormonal sy...

Journal: :Microelectronics Reliability 2006
A. M. Albadri Ronald D. Schrimpf Kenneth F. Galloway D. Greg Walker

Power electronic devices are susceptible to catastrophic failures when they are exposed to energetic particles; the most serious failure mechanism is single event burnout (SEB). SEB is a widely recognized problem for space applications, but it also may affect devices in terrestrial applications. This phenomenon has been studied in detail for power MOSFETs, but much less is known about the mecha...

2012
Christian Merkle

This dissertation contains contributions to the management of optical transport networks. The focus is on traffic modeling, analysis of failure mechanism, and the development of a novel semi-automatic network management system. The developed service oriented traffic models serve as input parameters for the network management system and include the special routing of the analyzed services. An ev...

1998
Abhijeet Kolpekwar R. D. Blanton David Woodilla

Wafer-level testing of surface-micromachined sensors provides ncw challenges to the test community. Currently, there is no method available for performing direct measurements to assess faulty micromechanical structures. Most commercial methods use electrical measurements to deduce the physical source of failures in the micromechanical structure. As a result, the process of identifyang various f...

Journal: :acta medica iranica 0
m. kadivar m. sadighi a. kiani a. kocharian

the mothers may be infected during pregnancy with infectious agents. mumps induced myocarditis, especially endocardial fibroelastosis, was previously a common disease of infants but is rare now. a 25 day old male infant admitted to the intensive care of our hospital because of cardiogenic shock. further studies revealed ischemic electrocardiograms, poor ventricular function, and positive result...

2002
P. V. Varde

Traditionally the statistical or more specifically probabilistic methods form the basic framework for assessing the reliability characteristics of the components. However the recent trend for predicting the reliability or life of the component involves application of physics-offailure methods. This rather new approach is finding wider application as it is based on basic fundamentals of science ...

2016
Matthew N. O. Sadiku Adebowale E. Shadare Emmanuel Dada Sarhan M. Musa Roy G. Perry

The physics of failure (POF) is an approach to designing reliable products to avoid failure, based on the knowledge of root cause failure mechanisms. It is based on failure reliability technology that studies the failure regularities from the failure reasons and failure mechanisms of the products. A clear understanding of the physics-of-failure is necessary in applications that afford little op...

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