نتایج جستجو برای: atomic measure
تعداد نتایج: 434106 فیلتر نتایج به سال:
The standard experimental techniques usually adopted in the study of the behaviour of ultracold atoms in optical lattices involve extracting the atom density profile from absorption images of the atomic sample after trap release. Quantum mechanically this procedure is described by a generalized measure (POVM); interference patterns found in absorption images suggest a generalized measure based ...
We present the first results from an experimental campaign to measure the atomic ablator-gas mix in the deceleration phase of gas-filled capsule implosions on the National Ignition Facility. Plastic capsules containing CD layers were filled with tritium gas; as the reactants are initially separated, DT fusion yield provides a direct measure of the atomic mix of ablator into the hot spot gas. Ca...
A Test Experiment at the Fermilab Booster to Study the Feasibility of Fast Antihydrogen Spectroscopy
Atomic antihydrogen has recently been observed at Fermilab [1]. It appears feasible to measure the principal structure, ne structure and Lamb shift of antihydrogen atoms in ight [2]. It is possible to test the proposed techniques and measure cross sections for the relevant atomic processes at relativistic velocities by rst using a proton beam. We propose to perform such a test at the FNAL Boost...
Let (Ω,Σ, μ) be a purely non-atomic measure space, and let 1 < p < ∞. If L(Ω,Σ, μ) is isomorphic, as a Banach space, to L(Ω,Σ, μ) for some purely atomic measure space (Ω,Σ, μ), then there is a measurable partition Ω = Ω1 ∪Ω2 such that (Ω1,Σ ∩ Ω1, μ|Σ∩Ω1) is countably generated and σ-finite, and that μ(σ) = 0 or ∞ for every measurable σ ⊆ Ω2. In particular, L(Ω,Σ, μ) is isomorphic to l.
Introduction: deBroigle’s 1924 suggestion that material particles such as atoms should have wave properties was arguably the key that unlocked quantum mechanics two years later. Starting in the mid 1980’s, workers in the new field of atom optics put this suggestion to use by developing ways to manipulate atoms as waves that can be diffracted and focussed. Our lab combined three atom gratings to...
An atomic force microscope was used to measure the loss tangent, tan , of a pressure-sensitive adhesive transfer tape as a function of frequency (0.01 to 10 Hz). For the measurement, the sample was oscillated normal to the surface and the response of the cantilever resting on the polymer surface (as measured via the photodiode) was monitored. Both oscillation amplitude and phase were recorded a...
porous silicon samples were prepared by electrochemical etching method for different etching times. the structural properties of porous silicon (ps) samples were determined from the atomic force microscopy (afm) measurements. the surface mean root square roughness (σ rms) changes as function of porosity were studied, and the influence of etching time on porosity and roughness was studied too. u...
Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
Abstract The conditional probability formula is supposed to reflect the correct updating of assignments when new information incorporated. Starting from a non-atomic measure, it proved that provides only transformed measure satisfying “minimum requirement” relational assumption. This result applies standard Bayesian parametric model.
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