نتایج جستجو برای: analog reliability measurement

تعداد نتایج: 622144  

2010
Akira Nishimura Nobuo Koizumi

A method of sampling jitter measurement based on time-domain analytic signals is proposed. Computer simulations and actual measurements were performed to compare the proposed method with the conventional method, in which jitter is evaluated from the amplitudes of sideband spectra for observed signals in the frequency domain. The results show that the proposed method is effective in that it 1) p...

2012
Aris Christou

Abstract A Monte Carlo simulation is reported for analog integrated circuits and is based on the modification of the failure rate of each component due to interaction effects of the failed components. The Monte Carlo technique is the methodology used to treat such circuits, since they are independent of the number of components and the degree of system complexity. The reliability model is appli...

Journal: :Research, Society and Development 2022

Aim: To translate, cross-cultural adapt and investigate the measurement properties of 25-point Friendship Scale to Brazilian-Portuguese. Methods: Translation adaptation Brazilian-Portuguese was conducted at first. Then, new version administered 160 Brazilians test-retest reliability, internal consistency, standard error (SEM), minimal detectable change (MDC), ceiling floor effects, concurrent v...

Journal: :TURKISH JOURNAL OF ELECTRICAL ENGINEERING & COMPUTER SCIENCES 2020

Journal: :The Korean Journal of Sports Medicine 2018

2009
Georges G. E. Gielen

With the advanced scaling of CMOS technology in the nanometer range, highly integrated mixed-signal systems can be designed. The use of nanometer CMOS, however, poses many challenges. This keynote presentation gives an overview of problems due to increased variability and reliability. Both have to be addressed by the designer, either at IC design time or through reconfiguration at IC run time. ...

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