Defect parameter extraction plays an important role in process control and yield prediction. A methodology of evaluating wafer level defect clustering will be presented to detect equipment specific particle contamination. For that, imaginary wafermaps of a variety of different chip areas are generated to calculate a yield-to-area dependency. Based on these calculations a Micro Density Distribut...

the modeling can provide a quantitative approach and consistency in the estimationsoil erosion and sediment yield by a wide range of conditions. in this study, the integration method of revised universal soil loss equation model, geographic information system and remote sensing techniques were used in order to identify the spatial distribution of soil erosion and sediment yield in the talar wat...

The effect of greenbug, Schizaphis graminum (Rondani), feeding on the yield of four winter wheat cultivars commonly grown in Oklahoma was studied. Cultivars tested were 'Karl', a recent derivative 'Karl-92', and '2163', all greenbug-susceptible cultivars; and 'TAM-110', a cultivar with resistance to biotype E greenbugs. The objectives were to determine the effect of different greenbug densities...

in order to investigate the effect of water stress at heading stage on grain yield and yield components of eight wheat cultivars, in 2008 year a research was conducted in the two regions esfahan and ardestan by using split plot in a randomized complete block design with three replications which that two irrigation treatments included custom and late season water stress were main factor and 8 wh...