نتایج جستجو برای: yield

تعداد نتایج: 194156  

2013
C. L. Loza J. S. Craven L. D. Yee M. M. Coggon R. H. Schwantes M. Shiraiwa X. Zhang K. A. Schilling N. L. Ng M. R. Canagaratna P. J. Ziemann R. C. Flagan

Introduction Conclusions References

1999
Kenneth W. Tobin Thomas P. Karnowski Shaun S. Gleason David Jensen Fred Lakhani

As integrated circuit fabrication processes continue to increase in complexity, it has been determined that data collection, retention, and retrieval rates will continue to increase at an alarming rate. At future technology nodes, the time required to source manufacturing problems must at least remain constant to maintain anticipated productivity. Strategies and software methods for integrated ...

2008
Puneet Gupta Evanthia Papadopoulou

ion of manufacturing constraints into a set geometric of constraints or design rules for the layout designers to follow have traditionally been foundry’s main method to ensure high probability of correct fabrication of integrated circuits. Typical design rules are constraints on width, spacing or pattern density. Origins of design rules lie various manufacturing steps such as lithography, etch,...

1983
Roshan P. James Amr Sabry

Many mainstream languages have operators named yield that share common semantic roots but differ significantly in their details. We present the first known formal study of these mainstream yield operators, unify their many semantic differences, adapt them to to a functional setting, and distill the operational semantics and type theory for a generalized yield operator. The resultant yield, with...

Journal: :Lisp and Symbolic Computation 1998
Sanjeev Kumar Carl Bruggeman R. Kent Dybvig

Just as a traditional continuation represents the rest of a computation from a given point in the computation, a subcontinuation represents the rest of a subcomputation from a given point in the subcomputation. Subcontinuations are more expressive than traditional continuations and have been shown to be useful for controlling tree-structured concurrency, yet they have previously been implemente...

Journal: :IEEE Design & Test of Computers 2012
Scott Davidson

h EXCEPT FOR GETTING your chip to market on time, optimizing yield is perhaps the most important thing we can do to improve IC profitability. We address this problem in several ways: design for manufacturability (DFM) through layout rules, process control, and increasingly clean cleanrooms. In an ideal world, this would solve our yield problems. We know it doesn’t, so we build a diagnostic capa...

Journal: :international journal of advanced biological and biomedical research 2014
jamal saadati mehdi baghi

objective:  in addition to the role of organic matter in plant nutrition, this material improves soil quality, physical structure, ventilation and water supply, and ease of penetration and expansion is rooted deep in the soil surface. effects of organic matter due to climatic factors, soil characteristics may vary from region to region, resulting in organic materials management must be given to...

Journal: :international journal of advanced biological and biomedical research 2014
sina mohammadi aghdam farhood yeganehpoor bijan kahrariyan edris shabani

according to urgent need of corn to nitrogen and since this element play a main role in improving of yield corn, thus, in order to investigate the effect of different levels of urea on yield and yield components of corn 704, an experiment was conducted randomized block with three replications in cropping year of 2012. experimental treatments included six levels of urea (0, 30, 60, 90, 120 and 1...

2004
Christophe Pérignon Daniel R. Smith

The term structure of interest rates is often summarized using a handful of yield factors that capture shifts in the shape of the yield curve. In this paper, we develop a comprehensive model for volatility dynamics in the level, slope, and curvature factors that simultaneously includes level and GARCH effects along with regime shifts. We show that the level of the short-rate is useful in modeli...

1998
Pranab K. Nag

In this paper, a method to predict defect-related yield as a function of time for a semiconductor manufacturing facility is presented. The effect of contamination-related defects on yield, and the reduction in defect levels, resulting from failure analysis, have been considered. The developed yield learning model is incorporated in a prototype simulator ,Y4 ,which mimics both the fabrication an...

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