AMPTEK INC. 14 DeAngelo Drive, Bedford, MA 01730-2204 U.S.A. APPLICATIONS • X-Ray Fluorescence • Thin-film Analysis • RoHS/WEEE Analysis • Teaching and Research • Art and Archaeology • Process Control • X-ray Tube Characterization FEATURES • Fundamental parameters (FP) • Analysis with or without standards • General bulk and thin-film analysis • Analyze up to 40 elements • Supports all Amptek de...

Nanocrystalline cadmium sulfide thin films as antireflection materials for solar cells have been prepared by a new chemical solution deposition route in an aqueous medium at 50 °C. as-deposited thin films were studied using X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), and optical absorption spectra. X-ray diffraction data indicated the formation of hexagonal na...

An x-ray-diffraction method that directly senses the phase of the structure factor is demonstrated and used for determining the local polarity of thin ferroelectric films. This method is based on the excitation of an x-ray standing-wave field inside the film as a result of the interference between the strong incident x-ray wave and the weak kinematically Bragg-diffracted x-ray wave from the fil...

Polyvinylpyrrolidone  /  Nickel  oxide  (PVP/NiO)  dielectrics  were fabricated  with  sol-gel  method  using  0.2  g  of  PVP  at  different working  temperatures  of  80,  150  and  200  ºC.  Structural  properties and surface morphology of the hybrid films were investigated by X- Ray  diffraction  (XRD)  and  Scanning  Electron Microscope  (SEM) respectively. Energy dispersive X-ray spec...

OBJECTIVE To evaluate the efficiency of quality control performance for a general x-ray machine between computed radiography (CR) and film method. MATERIAL AND METHOD CR performance as a quality control method for a general x-ray machine was compared to the film method. Two raters independently analyzed the result of quality control from both methods. Economic evaluation was performed by cost...

We found that certain mid-range consumer-level digital single-lens reflex (SLR) cameras using full-frame complementary metal oxide semiconductor (CMOS) sensors outperform X-ray film in acquiring signals from immunoblots that use enhanced chemiluminescence for detection. These cameras exhibit a sensitivity comparable to X-ray film, yet they provide a 3-fold increase in linear dynamic range and s...

generally arranged at a distance of 0.1 nm to 0.5 nm from one another. When such a substance is irradiated with X-rays having a wavelength roughly equivalent to the interatomic or intermolecular distance, the Xray diffraction phenomenon will take place. X-ray diffraction is widely used in the semiconductor field because it is nondestructive and yields crystal structure information relatively ea...