Metrology has a stigma of being non-productive and in many cases the aim of production engineers is to reduce metrology costs to an absolute minimum. This paper analyzes the role of metrology in production and demonstrates, how metrology can generate value. It illustrates different ways to evaluate the benefit of metrology and gives metrologists guidance to sell metrology with economic argument...

The measurements repeat 10 times, and the averages of the error measures are listed in Table III. As can be seen in Table III, the orientation errors of the planar features are all very small. The average absolute position error using the linear method is 82.62 m, and the average location error of planar features is 53.12 m. Using the proposed method, the average absolute position error is redu...

A new technique for three-dimensional (3D) camera calibration for machine vision metrology using off-the-shelf TV cameras and lenses is described. The two-stage technique is aimed at efficient computation of camera external position and orientation relative to object reference coordinate system as well as the effective focal length, radial lens distortion, and image scanning parameters. The two...

 This paper describes the Metrovisionlab computer application implemented as a toolbox for the Matlab program. It is designed for learning the key aspects of camera calibration techniques in dimensional metrology applications such as laser triangulation sensors and photogrammetry or stereovision systems. The software is used in several industrial vision courses for senior undergraduate mechani...

This paper is a contribution to the NIST Centennial 2001. It presents the first complete English translation of the inaugural speech of Heike Kamerlingh Onnes on the occasion of his appointment as Professor at the University of Leiden (The Netherlands) in 1882. The speech is a snapshot of the scientific landscape of that time and lays out a vision. It advocates with enthusiasm the significance ...

The operational cost of 300mm wafer production is significantly greater than that of 200mm fabs. Real-time monitoring of product can save time and money through reduced scrap and decreased cycle time. Current process monitoring generally incorporates stand-alone metrology, which is time consuming and requires excessive wafer handling by production operators. The benefits of integrated metrology...

The art in the present literature involves a method and an apparatus for improving vision system using a combination of laser based retinal imaging system, HartmannShack wavefront sensor, wavefront compensation device such as deformable mirrors, and advanced user feedback and imaging processing algorithm. Together, they enable precise measurement of higher order aberrations beyond defocus and a...