due to the expected increase of defects in circuits based on deep submicron technologies, reliability has become an important design criterion. although different approaches have been developed to estimate reliability in digital circuits and some measuring concepts have been separately presented to reveal the quality of analog circuit reliability in the literature, there is a gap to estimate re...

this paper presents a fault location technique for transmission lines with minimum current measurement. this algorithm investigates proper current ratios for fault location problem based on thevenin theory in faulty power networks and calculation of short circuit currents in each branch. these current ratios are extracted regarding lowest sensitivity on thevenin impedance variations of the netw...