We describe an approach to the synthesis of a benchmark test suite for evaluation of coverage analyzers, and new tools for test generation that have been developed for PVS and SAL.

Understanding the effectiveness of their production tests is a critical task for IC suppliers. Numerous trends suggesting that conventionally applied test methods must change to meet future needs will make the task even more critical – and difficult – in the future. This paper presents characterization and diagnostic data and ideas aimed at helping IC suppliers understand test effectiveness.