نتایج جستجو برای: si 2p spectra

تعداد نتایج: 185217  

2017
Min Zuo Yu Dong Degang Zhao Yan Wang Xinying Teng

In this article, the anti-poison performance of novel Al-6Y-2P master alloy for impurity Ca in hypereutectic Al-Si alloys was investigated in detail. According to the microstructural analysis, it can be found that the primary Si and eutectic Si particles could be relatively modified and refined. In order to investigate the influence mechanism of Ca on the limited refinement performance of Al-6Y...

Journal: :Physical review letters 2004
D Cubaynes M Meyer A N Grum-Grzhimailo J-M Bizau E T Kennedy J Bozek M Martins S Canton B Rude N Berrah F J Wuilleumier

Completely fine-structure-resolved photoelectron spectra produced from sodium atoms selectively excited into the Na* 2p(6)3p (2)P(1/2) and (2)P(3/2) states were obtained using a third generation synchrotron source in conjunction with laser pumping and high-resolution spectrometry. The spectra show dramatically different behaviors. The strong variations observed in the regions of the Na+ 2p(5)3p...

2005
T. P. Chen

In this study, the analysis of the XPS Si 2p peaks shows the existence of the five chemical structures corresponding to the Si oxidation states Si n+ (n =0, 1, 2, 3, and 4) in Si-implanted SiO2 films, and the concentration of each oxidation states is determined quantitatively. The evolution of the five Si oxidation states as a function of thermal annealing is studied. On the other hand, Si 2p c...

2008
I. Preda M. Abbate F. Yubero L. Alvarez

We report the Ni 2p x-ray photoelectron spectra of NiO thin films grown on different oxide substrates, namely, SiO2, Al2O3, and MgO. The main line of the Ni 2p spectra is attributed to the bulk component, and the shoulder at 1.5 eV higher binding energies to the surface component. The spectra of the NiO thin films show strong differences with respect to that of bulk NiO. The energy separation b...

2007
L. F. J. Piper Leyla Colakerol Timothy Learmonth Kevin E. Smith F. Bechstedt T. D. Moustakas

The electronic structure of wurtzite InN 0001̄ thin films has been studied using a combination of soft x-ray emission and absorption spectroscopies. We measured the elementally and orbitally resolved InN valence and conduction bands by recording the N K-edge spectra. Theoretical calculations of the N 2p partial density of states were performed within the GW framework of many body perturbation th...

2002
H. Suhl

Resonant photoemission spectra of the O 2p-derived valence band of insulating ThO2 are compared to linear muffin-tin orbital (LMTO) density-of-state (DOS) and XPS intensity calculations. At Th 5d corelevel threshold energies (85 ~< hv <<. 120eV), resonance is greatest at the bottom of the O 2p band where calculated p/d hybrid states are greatest; p / f hybrid content is weak by comparison. We c...

1999
Walter Hansch Anri Nakajima Shin Yokoyama

Core-level intensities for Si 2p , Si 2s , O 1s , and N 1s were measured by x-ray photoelectron spectroscopy in bulk samples of silicon, SiO2 and Si3N4. A complete and consistent set of intensity ratios is given and applied for calculations of thickness and stoichiometry in thin Si/oxide/nitride layers, which can be used for gate dielectrics in advanced metal–oxide–semiconductor field-effect tr...

2007
A. Gutiérrez J. L. Endrino S. Palacín F. Schäfers

Nanostructured ceramic coatings are being intensively investigated because they open a wide field of new materials with improved mechanical and tribological properties. The final behaviour of such coatings depends on their composition and microstructure. Si addition in nitride compounds has shown to improve significantly their hardness. For instance, in the TiSi-N coating system, coating hardne...

Journal: :Surface Science Spectra 2023

Bulk boron was analyzed using both XPS and high-resolution high energy x-ray photoelectron spectroscopy. The spectra of obtained monochromatic Al Kα radiation include survey scan B 1s, O N C Ar 2p. Cr with at 5414.8 eV 2p, 1s.

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