This letter reports the design, fabrication, and testing of a multifunctional scanning probe array for nanoscale imaging and patterning. The probe array consists of multiple cantilever probes, with each probe being able to perform a dedicated function such as scanning probe lithography (e.g., dip pen nanolithography and scanning probe contact printing) or scanning probe microscopy (e.g., atomic...

scanning hall probe microscopy (shpm) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. this method is based on application of the hall effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  shpm provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

Nanomaterials derive their electronic, magnetic, and optical properties from specific nanostructure. In most cases, nanostructured materials are defined during the growth, nanofabrication techniques, such as lithography, employed subsequently for device fabrication. Herein, a perspective is presented on different approach creating nanomaterials devices where, after advanced techniques used to d...

The development of a scalable and cost-effective nanofabrication method is key importance for future advances in nanoelectronics. Thermal scanning probe lithography (t-SPL) growing nanopatterning with potential parallelization, offering unique capabilities that make it an attractive candidate industrial nanomanufacturing. Here, we demonstrate the possibility to apply t-SPL fabrication graphene ...

Scanning probe techniques scanning tunneling microscopy (STM) and atomic force microscopy (AFM) have emerged as unique local probes for imaging, manipulation, and modification of surfaces at the nanoscale. Exercising the fabrication of atomic and nansocale devices with desired properties have demanded rapid development of scanning probe based nanolithographies. Dip pen nanolithography (DPN) and...

Since the invention of scanning tunnelling microscopy (STM) [1] and atomic force microscopy (AFM) [2], a new class of local probe microscopes has entered the laboratories around the world. Scanning probe microscopy (SPM) uses probing tips to map properties, such as topography, local adhesive forces, elasticity, friction or magnetic properties. In the emerging fields of nanoscience and nanotechn...

We present scanning-probe images and magnetic-field plots which reveal fractal conductance fluctuations in a quantum billiard. The quantum billiard is drawn and tuned using erasable electrostatic lithography, where the scanning probe draws patterns of surface charge in the same environment used for measurements. A periodicity in magnetic field, which is observed in both the images and plots, su...

This paper describes a thermal imaging system which includes a customized micromachined thermal probe and circuit interface for a scanning microscopy instrument. The probe shank is made from polyimide for mechanical compliance and high thermal isolation, and has a thin-film metal tip of ≈50 nm in diameter. The circuit provides closed-loop control of the tip temperature and also permits it to be...

In addition to its well-known capabilities in imaging and spectroscopy, scanning probe microscopy sSPMd has recently shown great potentials for patterning of material structures in nanoscales. It has drawn the attention of not only the scientific community, but also the industry. This article examines various applications of SPM in modification, deposition, removal, and manipulation of material...