نتایج جستجو برای: scanning near field optical microscopy

تعداد نتایج: 1472455  

Journal: :Micron 2007
A Drezet A Hohenau J R Krenn M Brun S Huant

We present an overview of recent progress in "plasmonics". We focus our study on the observation and excitation of surface plasmon polaritons (SPPs) with optical near-field microscopy. We discuss in particular recent applications of photon scanning tunnelling microscope (PSTM) for imaging of SPP propagating in metal and dielectric wave guides. We show how near-field scanning optical microscopy ...

Journal: :Optics express 2007
Jeffrey E Hall Gary P Wiederrecht Stephen K Gray Shih-Hui Chang Seokwoo Jeon John A Rogers Renaud Bachelot Pascal Royer

Heterodyne detection for apertureless near-field scanning optical microscopy was used to study periodic gold nanowell arrays. Optical near-field amplitude and phase signals were obtained simultaneously with the topography of the gold nanowells and with different polarizations. Theoretical calculations of the near-fields were consistent with the experiments; in particular, the calculated amplitu...

Journal: :Ultramicroscopy 2010
H Chibani K Dukenbayev M Mensi S K Sekatskii G Dietler

We report the first use of polymethylmethacrylate (PMMA) optical fiber-made probes for scanning near-field optical microscopy (SNOM). The sharp tips were prepared by chemical etching of the fibers in ethyl acetate, and the probes were prepared by proper gluing of sharpened fibers onto the tuning fork in the conditions of the double resonance (working frequency of a tuning fork coincides with th...

Journal: :Journal of the Optical Society of America. A, Optics, image science, and vision 2001
J L Bohn D J Nesbitt A Gallagher

The near field of an apertureless near-field scanning optical microscopy probe is investigated with a multiple-multipole technique to obtain optical fields in the vicinity of a silicon probe tip and a glass substrate. The results demonstrate that electric field enhancements of >15 relative to the incident fields can be achieved near a silicon tip, implying intensity enhancements of several orde...

Journal: :e-Journal of Surface Science and Nanotechnology 2012

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