We optimized synthesis conditions of blue-emitting CaMgSi2O6:Eu 2+ (CMS:Eu) with conventional solid-state reaction and successfully determined structure parameters by Rietveld refinement method with neutron powder diffraction data. The final weighted R-factor Rwp was 6.42% and the goodness-of-fit indicator S ( Rwp/Re) was 1.34. The refined lattice parameters of CMS:Eu were a 9.7472(3) Å, b 8.93...

X-ray powder diffractometry/Rietveld refinement was employed to estimate the purity of several chrysotile powders for calibrating standards. α-Corundum powder was mixed into each chrysotile sample as an internal standard. X-ray diffractometry was performed on these mixtures, and the mass fractions of amorphous and impurity phase content were calculated using Rietveld refinement. The chrysotile ...

This paper presents a method of reducing the X-ray diffraction data collection time, while maintaining high data quality, suitable for Rietveld refinement. The approach taken here is that phases in general show peak broadening as well as a loss of intensity with increasing 2-theta. Thus, by splitting the full analyzed 2-theta range into regions and adjusting the step-size and counting time to a...

Simulations of 29Si and 23Na MAS NMR spectra indicate the presence of differing proportions of two polytypes and a third phase in three samples of penkvilksite, Na4Ti2Si8O22•5H2O. The most abundant peaks are assigned to the 2O and 1M polytypes, and a third set of peaks are provisionally assigned to a proposed 2M polytype. The quadrupolar interaction parameters for 23Na, Cq and , were calculated...

This is the fourth in a series of papers on Rietveld materials characterisation metrology presented at recent Denver X-ray Conferences [refs 1-3]. Reference 3 examined the management of the zero-point and specimen displacement corrections in extracting lattice parameters from BraggBrentano x-ray diffraction data by Rietveld analysis. This paper emphasises the importance of pre-determining the z...

X-ray diffraction is one of the most effective tools for the characterization of the stacking defects which occur frequently in clayminerals.Modelling of the diffraction patterns of oriented mounts is often used for obtaining structural information about the nature of stacking order. Manual matching of calculated and observed patterns is time consuming and the results are user dependent and esp...