The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. As delay testing using external testers requires expensive ATE, built-in self test (BIST) is an alternative technique that can significantly reduce the test cost. It has been proven that Single Input Change (SIC) test s...

The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. As delay testing using external testers requires expensive ATE, built-in self test (BIST) is an alternative technique that can significantly reduce the test cost. It has been proven that Single Input Change (SIC) test s...

This paper proposes a Time Delay nonlinear dynamic model of HIV-1 (Human Immunodeficiency Virus type 1), introducing the drug consumption efficiencies as the controlling input for the model. The paper also represents the fuzzy T-S representation and the corresponding Fuzzy T-S controller. The controller parameters are tuned using LMIs (Linear Matrix Inequalities). The main focus is on the stabi...

In this paper we study the identification of a time-varying linear system from its response to a known input signal. More specifically, we consider systems whose response to the input signal is given by a weighted superposition of delayed and Doppler shifted versions of the input. This problem arises in a multitude of applications such as wireless communications and radar imaging. Due to practi...