نتایج جستجو برای: non linear gan

تعداد نتایج: 1714688  

2017
Juan Du Maofeng Zhong Dong Liu Shufang Liang Xiaolin Liu Binbin Cheng Yani Zhang Zifei Yin Yuan Wang Changquan Ling

Traditional Chinese medicine formulates treatment according to body constitution (BC) differentiation. Different constitutions have specific metabolic characteristics and different susceptibility to certain diseases. This study aimed to assess the characteristic genes of gan-shen Yin deficiency constitution in different diseases. Fifty primary liver cancer (PLC) patients, 94 hypertension (HBP) ...

Nowadays, the semiconductor nanowires (NWs) typically used in hydrogen gas sensors. Gallium nitride (GaN) with a wide band gap of 3.4 eV, is one of the best semiconductors for this function. NWs surface roughness have important role in gas sensors performance. In this research, GaN NWs have been synthesized on Si substrate by plasma-assisted vapor phase deposition at different deposition time, ...

2016
Tongtong Zhu Tao Ding Fengzai Tang Yisong Han Muhammad Ali Tom Badcock Menno J. Kappers Andrew J. Shields Stoyan K. Smoukov Rachel A. Oliver

Non- and semipolar GaN have great potential to improve the efficiency of light emitting devices due to much reduced internal electric fields. However, heteroepitaxial GaN growth in these crystal orientations suffers from very high dislocation and stacking faults densities. Here, we report a facile method to obtain low defect density non- and semipolar heteroepitaxial GaN via selective area epit...

In this article, the temperature behavior of output power of superluminescent light-emitting diode (SLED) by considering the effect of non-radiative recombination coefficient, non-radiative spontaneous emission coefficient and Auger recombination coefficients has been investigated. For this aim, GaN pyramidal quantum dots were used as the active region. The numerical method has been used to sol...

2005
H. J. Park C. Park S. Yeo S. W. Kang M. Mastro O. Kryliouk T. J. Anderson

This study reports a non-destructive method of measuring the residual strain in the GaN epilayer grown on sapphire substrate by micro-Raman spectroscopy. Operating in confocal mode this method allows a depth-dependent measurement of residual strain in the epitaxial layer without prior treatment of the sample. This approach to measurement of residual strain is demonstrated on GaN epitaxial films...

2011
S. M. O’Malley P. Revesz A. Kazimirov A. A. Sirenko

Synchrotron-based x-ray radiation has been utilized to measure time-resolved x-ray excited optical luminescence (TR-XEOL) from InGaN/GaN multiple quantum well (MQW) structures. Excess carrier recombination lifetimes were determined for MQWs grown on conventional c-plane as well as on non-polar m-plane substrates. In addition, the simultaneous measurement of XEOL and x-ray fluorescence reveals a...

2006
Abhishek Motayed Albert V. Davydov Mark D. Vaudin Igor Levin

In this work we have demonstrated nanoscale GaN device structures made from individual GaN nanowires and electrical contacts utilizing focused ion beam FIB induced Pt deposition. These GaN nanowires were grown by direct reaction of Ga vapor with NH3 and had diameters ranging from 100 nm to 250 nm and lengths up to 200 m. As-grown nanowires were dispersed on SiO2 coated p++ Si substrate. A 30 ke...

2016
Priti Gupta A. A. Rahman Shruti Subramanian Shalini Gupta Arumugam Thamizhavel Tatyana Orlova Sergei Rouvimov Suresh Vishwanath Vladimir Protasenko Masihhur R. Laskar Huili Grace Xing Debdeep Jena Arnab Bhattacharya

Most III-nitride semiconductors are grown on non-lattice-matched substrates like sapphire or silicon due to the extreme difficulty of obtaining a native GaN substrate. We show that several layered transition-metal dichalcogenides are closely lattice-matched to GaN and report the growth of GaN on a range of such layered materials. We report detailed studies of the growth of GaN on mechanically-e...

2011
Michele Esposto Sriram Krishnamoorthy Digbijoy N. Nath Sanyam Bajaj Ting-Hsiang Hung Siddharth Rajan

We report on our investigation of the electrical properties of metal/Al2O3/GaN metal-insulatorsemiconductor capacitors. We determined the conduction band offset and interface charge density of the alumina/GaN interface by analyzing the capacitance-voltage characteristics of atomic layer deposited Al2O3 films on GaN substrates. The conduction band offset at the Al2O3/GaN interface was calculated...

2000
Alexander Balandin

The gate-voltage dependence of the low-frequency noise in GaN/AlGaN heterostructure field-effect transistors has been investigated in the linear and subsaturation regimes of operation. Analysis of experimental data for different transistors indicates that the noise spectrum is dominated by the channel noise rather than noise originated in series resistors. The obtained results shed new light on...

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