نتایج جستجو برای: march test algorithm

تعداد نتایج: 1574761  

2003
Said Hamdioui Zaid Al-Ars Ad J. van de Goor Mike Rodgers

The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all possible linked faults. The tests are merged into a single test, March SL, detecting all faults in the linked fault space. The preliminary test results of an experiment done at Intel will be reported; they show that Mar...

2011
N. M. Sivamangai

Problem statement: As technology scales down, the integration density of transistors increases and most of the power is dissipated as leakage. Leakage power reduction is achieved in Static Random Access Memory (SRAM) cells by increasing the source voltage (source biasing) of the SRAM array. Another promising issue in nanoscaled devices is the process parameter variations. Due to these variation...

2002
Said Hamdioui Ad J. van de Goor Mike Rodgers

This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for Random Access Memories (RAMs), and shows that none of the current industrial march tests has the capability to detect all these faults. It therefore introduces a new test (March SS), with a test length of 22n, that detects all realistic simple static faults in RAMs.

2012
Ankita Tripathi A. P RAO

Very Large Scale Integration (VLSI) has made an extraordinary effect on the development of integrated circuit technology. It has not only decreased the dimension and the price but also improved the complexness of the circuits. There are, however, prospective issues which may slow down the efficient use and development of upcoming VLSI technology. Among these is the issue of circuit testing, whi...

2011
Stefano Di Carlo Gianfranco Politano Paolo Prinetto Alessandro Savino Alberto Scionti

The continuos shrinking of semiconductor’s nodes makes semiconductor memories increasingly prone to electrical defects tightly related to the internal structure of the memory. Exploring the e↵ect of fabrication defects in future technologies, and identifying new classes of functional fault models with their corresponding test sequences, is a time consuming task up to now mainly performed by han...

پایان نامه :وزارت علوم، تحقیقات و فناوری - پژوهشگاه فرهنگ و اندیشه اسلامی 1382

چکیده ندارد.

Journal: :Medical History 1995
Roger Cooter

involved, not least the leading player himself, Sir Henry Wellcome. So full praise to John Symons for having laid a firm path through this mixed vegetation and erected plain signposts to mark each succeeding stage on the way, as well as for the limpid prose ornamented by irony and understated wit with which he achieves this, to say nothing of his delightful footnotes. The section which speaks m...

In this paper, the relation among factors in the road transportation sector from March, 2005 to March, 2011 is analyzed. Most of the previous studies have economical point of view on gasoline consumption. Here, a new approach is proposed in which different data mining techniques are used to extract meaningful relations between the aforementioned factors. The main and dependent factor is gasolin...

2015
M. Anto Bennet G. Sankar Babu R. Suresh S. Mohammed Sulaiman S. Natarajan

Ternary content addressable memory (TCAM) is one key component in high-performance networking applications. An asymmetric TCAM cell consists of a binary content addressable memory (BCAM) bit and a mask bit. In this paper, we analyze comparison faults of the asymmetric TCAM cell based on BCAM comparison faults. Then march-like test algorithms T are proposed to cover the comparison faults of the ...

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