نتایج جستجو برای: ion bombardment

تعداد نتایج: 208031  

Journal: :Journal of Physics D 2023

Abstract A three-dimensional model based on molecular dynamics has been developed to describe the formation of a single cathode spot in vacuum arcs. The is assumed be controlled by plasma ions, effect which simulated LAMMPS through process ion bombardment. represented structured copper atoms, while ions are continuously injected into domain with certain velocity towards surface. Ion bombardment...

Journal: :Analytical chemistry 2006
S E Harton F A Stevie Z Zhu H Ade

13C labeling is introduced as a tracer for depth profiling of polymer films and multilayers using secondary ion mass spectrometry (SIMS). Deuterium substitution has traditionally been used in depth profiling of polymers but can affect the phase behavior of the polymer constituents with reported changes in both bulk-phase behavior and surface and interfacial interactions. SIMS can provide contra...

2003
I. C. Gebeshuber S. Cernusca F. Aumayr H. P. Winter

We present systematic scanning tunneling microscopy (STM)/atomic-force microscopic (AFM) investigations on nanoscopic defect production at atomically clean surfaces of SiO2, Al2O3 and highly oriented pyrolytic graphite (HOPG) after bombardment by slow (impact energy ≤ 1.2 keV) singly and multiply charged ions under strict ultra-high vacuum (UHV) conditions. Combined STM and AFM studies show tha...

2007
E. V. ALONSO R. A. BARAGIOLA

Electron yields from clean and oxydized Inconel 625 surfaces have been measured for H', H:, Hef, 0' and Ar+ ions at normal incidence in the energy range 1.5-40 keV. These measurements have been made under ultrahigh vacuum and the samples were freed of surface contaminants by bombarding with high doses of either 20 keV H l or 30 keV Ar+ ions. Differences in yields of oxydized versus clean surfac...

2016
Lukasz Rzeznik Yves Fleming Tom Wirtz Patrick Philipp

Secondary ion mass spectrometry (SIMS) on the helium ion microscope (HIM) promises higher lateral resolution than on classical SIMS instruments. However, full advantage of this new technique can only be obtained when the interaction of He(+) or Ne(+) primary ions with the sample is fully controlled. In this work we investigate how He(+) and Ne(+) bombardment influences roughness formation and p...

2016
W. Hink W. HINK

2014 The available experimental and theoretical results on ion induced X-rays are briefly surveyed. From experimental data it may be concluded that the mechanism for inner shell excitation by heavy ion-atom collisions is different from that for proton-atom collisions. The latter are described successfully in Plane Wave Born Approximation (PWBA) and in classical Binary Encounter Approximation (B...

Journal: :Journal of the Japan Society for Aeronautical and Space Sciences 1973

Journal: :Clinical chemistry 1985
G Moneti G Agati M G Giovannini M Pazzagli R Salerno G Messeri M Serio

We describe a mass-spectrometric method based on the fast atom bombardment ionization technique in the negative-ion mode for measuring pregnanediol-3 alpha-glucuronide in diluted urine from women. The procedure requires addition of testosterone-17 beta-D-glucuronide (2.5 micrograms/25 microL) to the urine sample as internal standard, and the sample is added directly to the fast atom bombardment...

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