Techniques for characterization and methods for fabrication at the nano-scale are becoming more powerful, giving new insights into the spatial relationships between nanostructures and greater control over their development. A case in point is the application of state-of-the-art focused ion beam technology (FIB), in combination with high-performance scanning electron microscopy (SEM), giving the...

High-energy heavy ions cause severe local damage, injury, or inactivation to living organisms through highdensity local energy delivery. The JAERI AVF cyclotron and electrostatic accelerators in TIARA have been applied to biological studies covering cell surgery technique for plant breeding, high-LET specific mutation induced by ion beam, and the repair of DNA damage on radiation resistant bact...

Halo formation and control in space-charge-dominated electron and ion beams are investigated in parameter regimes relevant to the development of high-power microwave (HPM) sources and highintensity electron and ion linear accelerators. In particular, a mechanism for electron beam halo formation is identified in high-power periodic permanent magnet (PPM) focusing klystron amplifiers. It is found...

The application of theory and experiments to the elastic scattering in ion beam techniques has been investigated. Experimental elastic scattering cross sections for + Ni, p + , Li + Ni, B + Ni and C + I scattering systems have been determined. The optical model and R-matrix analyses have been applied to the experimental data. The calculated cross sections were found to be in very good agreement...

We report nanoscale patterning of graphene using a helium ion microscope configured for lithography. Helium ion lithography is a direct-write lithography process, comparable to conventional focused ion beam patterning, with no resist or other material contacting the sample surface. In the present application, graphene samples on Si/SiO2 substrates are cut using helium ions, with computer contro...

By sputtering organic films with 10 kV, 10 nA C60+ and 0.2 kV, 300 nA Ar+ ion beams concurrently and analyzing the newly exposed surface with X-ray photoelectron spectroscopy, organic thin-film devices including an organic light-emitting diode and a polymer solar cell with an inverted structure are profiled. The chemical composition and the structure of each layer are preserved and clearly obse...