نتایج جستجو برای: first quarter wave thickness

تعداد نتایج: 1732643  

Journal: :iranian biomedical journal 0
youcef remram مختار عطاری mokhtar attari noureddine ababou

accurate measurements of physical characteristics of bone are essential for diagnosis, assessment of change following treatment, and therefore, indirectly, for evaluation of new forms of therapy. this is particularly true of osteoporosis and aging skeleton, in which fractures occur easily. methods: in this study an ultrasonic system was set-up and calibrated on plexiglas tubes of variable thick...

2009
aximillian A. Perez John Kitching Andrei M. Shkel

This paper reports on the design and implementation of high efficiency, nonmetallic reflectors integrated on the sidewalls of micromachined cavities. Due to shadowing from deposition within a cavity, significant variation in the thicknesses of the dielectric thin films composing the reflectors are encountered when the layers are deposited by Plasma Enhanced Chemical Vapor Deposition (PECVD). Th...

Journal: :فیزیک زمین و فضا 0
محمد علی ریاحی دانشیار، گروه فیزیک زمین، مؤسسة ژئوفیزیک دانشگاه تهران سیدهاشم طباطبائی استادیار، بخش ژئوتکنیک، مرکز تحقیقات ساختمان و مسکن، علی بیت اللهی استادیار، بخش ژئوتکنیک، مرکز تحقیقات ساختمان و مسکن، عباس قلندرزاده دانشیار، گروه مهندسی عمران، دانشکده فنی دانشگاه تهران مرتضی طالبیان استادیار، پژوهشکده علوم زمین، سازمان زمین شناسی و معدنی، مرتضی فتاحی استادیار، گروه فیزیک زمین، مؤسسة ژئوفیزیک دانشگاه تهران

seismic refraction and downhole survey were employed to study dynamic characteristics of subsurface materials in bam city, southeast of iran. the data acquisition was performed at 160 p and s-wave refraction stations and 15 boreholes in the city. to derive velocity depth sections along these profiles as well as to perform downhole diagrams, seisimager software was used. based on the obtained va...

Journal: :Journal of Physics: Conference Series 2011

Journal: :Journal of the Practice of Cardiovascular Sciences 2019

Journal: :Applied optics 1992
R M Azzam K A Giardina

At a given wavelength lambda we determine all possible solution pairs (?, zeta) of the incidence angle ? and the thickness zeta of a transparent thin film on an absorbing substrate that achieve a given unpolarized light reflectance R(u). The trajectory of the point that represents a solution pair in the zeta, ? plane depends on the optical properties of the film and substrate and on whether R(u...

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