نتایج جستجو برای: field ion microscope

تعداد نتایج: 1015276  

2014
In-Yong Park Takashi Ogawa Boklae Cho Cheolsu Han Ju Hwang Kim Sang Jung Ahn

For a long time, the ultra-sharp tips are used for high resolution microscope, such as scanning tunneling microscope (STM), atomic force microscope (ATM), field emission scanning electron microscope (FE-SEM). In addition, helium ion microscope (HIM), which has sub-nanometer imaging resolution, employs the tip as gas field ionization source (GFIS) in recent years. There are a lot of required vit...

Journal: :The Review of scientific instruments 2007
Alexander Tselev Steven M Anlage Zhengkun Ma John Melngailis

We demonstrate that a near-field microwave microscope based on a transmission line resonator allows imaging in a substantially wide range of frequencies, so that the microscope properties approach those of a spatially resolved impedance analyzer. In the case of an electric probe, the broadband imaging can be used in a direct fashion to separate contributions from capacitive and resistive proper...

2010
Andy T. Wu Thomas Jefferson

A Surface Science Laboratory (SSL) has been established at JLab to study surfaces relevant to superconducting radio frequency (SRF) cavities. Current operational facilities include a scanning electron microscope equipped with energy dispersive x-ray analysis, a secondary ion mass spectrometry, a metallographic optical microscope, a transmission electron microscope, a high precision and large sc...

2008
K. Yamaguchi M. Kitazawa Y. Sugita J. Tanaka M. Tanemura Y. Hayashi

Graphite surfaces were bombarded with Ne, Ar and Xe ions at 450 eV–1 keV to induce the carbon nanofiber (CNF) growth at room temperature, and the dependence of size and numerical density of ion-induced CNFs on the ion species and ion energy was investigated in detail. The ion-sputtered surfaces were covered with densely distributed conical protrusions and aligned CNFs grew on the tips, except f...

Journal: :Proceedings, annual meeting, Electron Microscopy Society of America 1994

2017
J. C. Weeber Y. Lacroute Alain Dereux E. Devaux T. Ebbesen C. Girard M. U. Gonzalez A. L. Baudrion Jean-Claude Weeber Yvon Lacroute Thomas Ebbesen Christian Girard

Surface plasmon waveguides (SPW’s) are metal ridges featuring widths in the micrometre range and thicknesses of a few tens of nanometres. A focused ion beam (FIB) has been used to carve micro–scatterers into gold SPW’s and the near–field distributions around these micro-structures are observed by means of a Photon Scanning Tunneling Microscope (PSTM). On the basis of near-field images, we show ...

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