نتایج جستجو برای: ellipsometry
تعداد نتایج: 2054 فیلتر نتایج به سال:
Abstract The Mueller matrix is a mathematical description of how light altered by an optical element or sample under study. It describes both intensity (irradiance) and polarization changes, including reduction the total polarization. spectroscopic ellipsometry has gained recent popularity in optics semiconductor communities as effective means to characterize complex structures anisotropic mate...
We present a setup for time-resolved spectroscopic ellipsometry in pump–probe scheme using femtosecond laser pulses. As probe, the system deploys supercontinuum white light pulses that are delayed with respect to single-wavelength pump A polarizer–sample–compensator–analyzer configuration allows ellipsometric measurements by scanning compensator azimuthal angle. The transient parameters obtaine...
This study investigated the behavior and molecular organization of synthetic artificial mimic molecules that resemble the following tetraether lipids: di-O-hexadecyl-glycero-3-phosphatidyl-glycerol (DHGPG) and bis-4-dodecylphenyl-12-phosphate. These molecules were analyzed using Langmuir film balance, ellipsometry and atomic force microscopy. The monolayer LangmuirBlodgett films of DHGPG and bi...
In the fabrication of silica films by sol-gel synthesis, the role of various catalysts is systematically examined. The precursor solutions were made by mixing tetraethylorthosilicate (TEOS), ethanol and water in the molar ratio of 1 : 2 : 2. The spin coated films were thermally treated at various temperatures, and characterised using ellipsometry, molecular probe ellipsometry (MPE), infrared sp...
Absorption properties of type-II InAs/InAsSb superlattices measured by spectroscopic ellipsometry" (2015).
Optical anisotropy of porous polymer film with inverse slanted nanocolumnar structure revealed via generalized spectroscopic ellipsometry" (2015).
Ellipsometry is a highly sensitive optical technique for coating characterization but usually presents multiple solutions in many cases. To prevent these, a method with addition of a spectral polarimetric technique is proposed. An initial film dispersion curve, independently of its physical thickness, is then provided using the same setup as spectral ellipsometry and at the same sample position...
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