نتایج جستجو برای: electron backscatter diffraction ebsd

تعداد نتایج: 355130  

2007
A. Koblischka-Veneva J. D. Wei I. V. Shvets

Magnetite thin films grown on 001 oriented MgO substrates are analyzed by means of electron backscatter diffraction EBSD analysis and magnetic force microscopy in applied fields. The EBSD technique enables the crystallographic orientation of individual grains to be determined with a high spatial resolution up to 20 nm on such ceramic samples. A high image quality of the recorded Kikuchi pattern...

2016
Jun Jiang Tiantian Zhang Fionn P E Dunne T Ben Britton

Deformation in materials is often complex and requires rigorous understanding to predict engineering component lifetime. Experimental understanding of deformation requires utilization of advanced characterization techniques, such as high spatial resolution digital image correlation (HR-DIC) and high angular resolution electron backscatter diffraction (HR-EBSD), combined with clear interpretatio...

Journal: :Ultramicroscopy 2010
Aimo Winkelmann Gert Nolze

We analyze the contrast reversal of Kikuchi bands that can be seen in electron backscatter diffraction (EBSD) patterns under specific experimental conditions. The observed effect can be reproduced using dynamical electron diffraction calculations. Two crucial contributions are identified to be at work: First, the incident beam creates a depth distribution of incoherently backscattered electrons...

2014
Yongliang Shao Lei Zhang Xiaopeng Hao Yongzhong Wu Yuanbin Dai Yuan Tian Qin Huo

We report a method to obtain the stress of crystalline materials directly from lattice deformation by Hooke's law. The lattice deformation was calculated using the crystallographic orientations obtained from electron backscatter diffraction (EBSD) technology. The stress distribution over a large area was obtained efficiently and accurately using this method. Wurtzite structure gallium nitride (...

2017
Gwénaëlle Proust Patrick Trimby Sandra Piazolo Delphine Retraint

One of the challenges in microstructure analysis nowadays resides in the reliable and accurate characterization of ultra-fine grained (UFG) and nanocrystalline materials. The traditional techniques associated with scanning electron microscopy (SEM), such as electron backscatter diffraction (EBSD), do not possess the required spatial resolution due to the large interaction volume between the ele...

Journal: :Journal of microscopy 2005
S C Wang Z Zhu M J Starink

Al-Mg-Cu-Mn alloys have been developed for the packaging industry, in which large cold-working deformations are normally applied that can produce high dislocation densities. In this study, we present a simplified model for the yield strength contributions and apply that to obtain the dislocation densities by determining the orientation factors, which can be obtained via the crystal information ...

Journal: :Ultramicroscopy 2008
Aimo Winkelmann

We present a model which describes the appearance of excess and deficiency features in electron backscatter diffraction (EBSD) patterns and we show how to include this effect in many-beam dynamical simulations of EBSD. The excess and deficiency features appear naturally if we take into account the anisotropy of the internal source of inelastically scattered electrons which are subsequently scat...

Journal: :Nano letters 2011
Joshua D Wood Scott W Schmucker Austin S Lyons Eric Pop Joseph W Lyding

Chemical vapor deposition of graphene on Cu often employs polycrystalline Cu substrates with diverse facets, grain boundaries (GBs), annealing twins, and rough sites. Using scanning electron microscopy (SEM), electron-backscatter diffraction (EBSD), and Raman spectroscopy on graphene and Cu, we find that Cu substrate crystallography affects graphene growth more than facet roughness. We determin...

Journal: :Ultramicroscopy 2013
Aimo Winkelmann Maarten Vos

In electron scattering from crystals, diffraction spots are replaced by Kikuchi patterns at high momentum transfer. Kikuchi pattern formation is based on the concept of effective incoherent electron sources (or detectors) inside a crystal. The resulting incoherence is a consequence of energy transfer connected with the momentum transfer in large-angle scattering events. We identify atomic recoi...

Journal: :Ultramicroscopy 2007
Aimo Winkelmann Carol Trager-Cowan Francis Sweeney Austin P Day Peter Parbrook

We present an approach for the simulation of complete electron backscatter diffraction (EBSD) patterns where the relative intensity distributions in the patterns are accurately reproduced. The Bloch wave theory is applied to describe the electron diffraction process. For the simulation of experimental patterns with a large field of view, a large number of reflecting planes has to be taken into ...

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