A technique for modelling arbitrary discontinuities in nite elements is presented. Both discontinuities in the function and its derivatives are considered. Methods for intersecting and branching discontinuities are given. In all cases, the discontinuous approximation is constructed in terms of a signed distance functions, so level sets can be used to update the position of the discontinuities. ...

One of the most important issues for Muslim philosophers is the continuous imaginal world and its relationship with the discontinuous imaginative faculty. The continuous imaginal world is a perceptive faculty of the soul known as the faculty of imagination. The discontinuous imaginative faculty is the order of the universe called the imaginal world, which Muslim philosophers have portrayed in a...

Data on discontinuities are always necessary for design, characterization and analysis of rock structures. The time honored method of manual measurements with Brunton compass is both time consuming and often inconvenient given issues such as restricted access to measurement areas, introduction of erroneous data due to sampling difficulties and human bias, considerable safety risks since measure...

We present a new version of the sequential discontinuous Galerkin method introduced in [25] for two-phase immiscible incompressible flows in heterogeneous porous media with a discontinuous capillary field. Here, a new implementation of the extended interface condition, that does not use the threshold saturation value at the interface and permits treatment of different residual saturations in di...

The Sierra Nevada mountain range consists of a vast array of different geologic features. One of these features is in the form of what are known as roof pendants. Roof pendants span through the central and southern portions of the eastern Sierra Nevada. Representing the geologic history of the Sierra Nevada mountain range in California, metamorphic roof pendants offer a glimpse into the past. T...

The cross-sectional texture of rock varnish varies considerably with the scale of analysis and technique used to image a sample. Each jump in resolution results in new insight, with the current state-of-the-art resting at the nanoscale. One key to nanoscale analysis involves focused ion beam (FIB) techniques used most frequently in material science and semiconductor failure analysis. FIB prepar...