Dielectric properties of materials are defined, and the major factors that influence these properties of agricultural and food materials, namely, frequency of the applied radiofrequency or microwave electric fields, and water content, temperature, and density of the materials, are discussed on the basis of fundamental concepts. The dependence of measured dielectric properties on these factors i...

The rectangular dielectric waveguide (RDWG) technique has been previously described for the determination of complex permittivity of a wide class of dielectric materials of various thicknesses and cross sections. This paper presents a unified RDWG technique for the determination of the dielectric constant of materials. Some measurement results are reported in the W -band frequencies to demonstr...

A novel method for estimating the dielectric properties of materials by applying different soft computing techniques is presented. Dielectric properties allow us to know other material characteristics such as moisture content, bio-content, chemical concentration, etc., which are of great importance on industrial or science fields. In this paper, we present a free-space measurement method along ...

In high frequency signal packaging, the plastic dielectric material takes on an increasingly important role in the performance of the signal transmission. Variations within the plastic can occur as a result of a number of manufacturing and environmental processes. These variations can be sufficient to change the dielectric properties. The extent of change to the dielectric properties of polymer...

A generalized technique is presented to measure the dielectric properties of lossy composite materials. The overall method is based on measuring the spectral domain reflection and transmission coefficients of the material-under-test (MUT) using a Vector Network Analyzer (VNA), and then finding the dielectric properties of MUT from the measured scattering data using a proposed reconstruction alg...

Non-uniformity of the dielectric properties of highmaterial due to random grain orientation and phase separation will lead to variation in characteristics between different devices. Here we present a model for phase separated highdielectrics and investigate, by means of 3D numerical device simulation, the intrinsic parameter fluctuations which result from this structural non-uniformity.

A microscopic model is employed to relate the dielectric tensor to the microstructure of isotropic amorphous or cubic crystalline materials. Electrostriction is characterized by dielectric parameters that describe how the dielectric tensor varies with deformation and the resulting change in the microstructure. These dielectric parameters are obtained for small deformations, and expressed in ter...

As the semiconductor nano-electronics industry progresses toward incorporating increasingly lower dielectric constant materials as the inter layer dielectric (ILD) in Cu interconnect structures, thermo-mechanical reliability is becoming an increasing concern due to the inherent fragility of these materials. Therefore, the need for metrologies to assess the mechanical properties and elastic cons...