نتایج جستجو برای: depth profiling

تعداد نتایج: 242779  

Journal: :ACS nano 2015
Jonathan B Gilbert Ming Luo Cameron K Shelton Michael F Rubner Robert E Cohen Thomas H Epps

X-ray photoelectron spectroscopy (XPS) depth profiling with C60(+) sputtering was used to resolve the lithium-ion distribution in the nanometer-scale domain structures of block polymer electrolyte thin films. The electrolytes of interest are mixtures of lithium trifluoromethanesulfonate and lamellar-forming polystyrene-poly(oligo(oxyethylene)methacrylate) (PS-POEM) copolymer. XPS depth profilin...

Journal: :Analytical and bioanalytical chemistry 2009
A Wucher J Cheng L Zheng N Winograd

Molecular time of flight secondary ion mass spectrometry (ToF-SIMS) imaging and cluster ion beam erosion are combined to perform a three-dimensional chemical analysis of molecular films. The resulting dataset allows a number of artifacts inherent in sputter depth profiling to be assessed. These artifacts arise from lateral inhomogeneities of either the erosion rate or the sample itself. Using a...

2015
S. O. Kucheyev M. Toth M. R. Phillips J. S. Williams C. Jagadish

Journal: :Analytical chemistry 2011
Dan Mao Caiyan Lu Nicholas Winograd Andreas Wucher

Time-of-flight secondary ion mass spectrometry and atomic force microscopy are employed to characterize a wedge-shaped crater eroded by a 40-keV C(60)(+) cluster ion beam on an organic film of Irganox 1010 doped with Irganox 3114 delta layers. From an examination of the resulting surface, the information about depth resolution, topography, and erosion rate can be obtained as a function of crate...

Journal: :The journal of physical chemistry. B 2006
Juan Cheng Andreas Wucher Nicholas Winograd

Peptide-doped trehalose thin films have been characterized by bombardment with energetic cluster ion beams of C60+ and Aux+ (x = 1, 2, 3). The aim of these studies is to acquire information about the molecular sputtering process of the peptide and trehalose by measurement of secondary ion mass spectra during erosion. This system is important since uniform thin films of approximately 300 nm thic...

2017
S. Walck T. Buyuklimanli J. Hren

Depth p r o f i l i n g w i t h the FIM/IAP can be ext remely accurate i f -.p done i n conjunct ion w i t h r i n g c o l lapse counting. However, under UHV cond i t i ons depth sca les are n o t e a s i l y assigned, especia l l y i f depths o f 0.1 um o r more are required, such as those needed f o r range determinat ions i n i o n imp lan ta t ion studies. We describe a method us ing the IA...

Journal: :Journal of the American Society for Mass Spectrometry 2016
Hua Tian Andreas Wucher Nicholas Winograd

Dynamic reactive ionization (DRI) utilizes a reactive molecule, HCl, which is doped into an Ar cluster projectile and activated to produce protons at the bombardment site on the cold sample surface with the presence of water. The methodology has been shown to enhance the ionization of protonated molecular ions and to reduce salt suppression in complex biomatrices. In this study, we further exam...

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