نتایج جستجو برای: based built in self

تعداد نتایج: 17639554  

2017
Marco d’Ischia Daniel Ruiz-Molina Josep Samitier

Marco d’Ischia 1,* ID and Daniel Ruiz-Molina 2,* ID 1 Department of Chemical Sciences, University of Naples Federico II, Via Cintia 4, I-80126 Naples, Italy 2 Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and BIST, Campus UAB, Bellaterra, 08193 Barcelona, Spain * Correspondence: [email protected] (M.d.I); [email protected] (D.R.-M.); Tel.: +39-081-674132 (M.d.I.); +34-093-737...

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه زنجان 1389

until now many studies have been done over recent decades throughout the world to show the right age to start english. in iran, research is still at an early stage in terms of evaluating teachers’ beliefs about teaching children english. the problem of at what age to start teaching english and how to teach english to elementary school children has not been solved neither in this country nor els...

2006
H. P. Chang W. A. Rogers J. A. Abraham

1.1 1:30 p.m. "An Efficient Self-Test Structure for Sequential Machines" S.Z. Hassan Rolm Mil-Spec Computers In this paper, a BIST structure for sequential machines is presented. The approach requires augmentation of the machine by the addition of an extra input and some logic. The test sequence is independent of the function implemented and depends only on the number of input combinations and ...

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه تربیت دبیر شهید رجایی - دانشکده علوم انسانی 1392

abstract due to the growing importance and influence of the self of the teacher in the field of educational and cognitive psychology, the current study intended to investigate the relationship between three teacher qualities and characteristics, i.e. teacher self efficacy, self regulation, and success as perceived by their learners. the study aimed at finding whether teacher self efficacy an...

Journal: :CoRR 2015
Nan Li Gunnar Carlsson Elena Dubrova Kim Petersen

Many believe that in-field hardware faults are too rare in practice to justify the need for Logic Built-In Self-Test (LBIST) in a design. Until now, LBIST was primarily used in safety-critical applications. However, this may change soon. First, even if costly methods like burn-in are applied, it is no longer possible to get rid of all latent defects in devices at leadingedge technology. Second,...

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه سیستان و بلوچستان - دانشکده ادبیات و علوم انسانی 1392

the construct of self-efficacy has received increasing attention in research over the past two decades. many studies have been carried out 1.3 significance of the study this study has pedagogical implications since improving students’ self- efficacy and autonomy is important for promoting actual performance on classroom academic tasks. in academic settings, it has been shown that self-effi...

Journal: :J. Embedded Computing 2005
Liviu Miclea Szilárd Enyedi Paolo Prinetto Alfredo Benso

Porto, the institutional repository of the Politecnico di Torino, is provided by the University Library and the IT-Services. The aim is to enable open access to all the world. Please share with us how this access benefits you. Your story matters. 1 Abstract—This article demonstrates how to use intelligent agents for testing and repairing a distributed system, whose elements may or may not have ...

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه تربیت دبیر شهید رجایی - دانشکده علوم انسانی 1393

according to research, academic self-concept and academic achievement are mutually interdependent. in the present study, the aim was to determine the relationship between the academic self-concept and the academic achievement of students in english as a foreign language and general subjects. the participants were 320 students studying in 4th grade of high school in three cities of noor, nowshah...

2007
S. Wu

1. Introduction Logic Built-In Self-Test (BIST) schemes based on STUMPS structure use on-chip circuitry to generate test stimuli and analyze test responses, with little or no help from an ATE. The STUMPS (Self-Test Using a MISR and Parallel Shift register sequence generator) structure applies pseudo-random patterns generated by a PRPG (Pseudo-Random Pattern Generator) to a full-scan circuit in ...

2007
V. Gherman

Built-in self-test (BIST) is an attractive approach to detect delay faults because of its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique that has been successfully applied to stuck-at fault testing. As delay faults have lower random pattern testability than stuck-at faults, the need for DLBIST schemes has increased. However, an extension to delay fault test...

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