High-resolution optical microscopy is an essential pre-requisite for life science force microscopy, particularly for applications in cell biology and medicine. Identification and validation of cells is typically established with techniques like phase contrast microscopy or differential interference contrast microscopy. The option to select or monitor individual cells online with such light micr...

porous silicon samples were prepared by electrochemical etching method for different etching times. the structural properties of porous silicon (ps) samples were determined from the atomic force microscopy (afm) measurements. the surface mean root square roughness (σ rms) changes as function of porosity were studied, and the influence of etching time on porosity and roughness was studied too. u...

One of the factors that limit the spatial resolution in atomic force microscopy (AFM) is the physical size of the probe. This limitation is particularly severe when the imaged structures are comparable in size to the tip's apex. The resolution in the AFM is usually enhanced by using sharp tips with high aspect ratios. In the present paper we propose an approach to modify AFM tips that consists ...

Theory predicts that the currents in scanning tunneling microscopy (STM) and the attractive forces measured in atomic force microscopy (AFM) are directly related. Atomic images obtained in an attractive AFM mode should therefore be redundant because they should be similar to STM. Here, we show that while the distance dependence of current and force is similar for graphite, constant-height AFM a...

bismuth sulfide nano-rods and nano-flowers were synthesized via a hydrothermal reaction at a relatively low temperature. thioglycolic acid is used as sulfur source and capping agent simultaneously. bi2s3 nanostructures were then added to acrylonitrile-butadiene-styrene (abs) copolymer. the thermal stability behavior of abs filled with bismuth sulfide nano-rods were investigated by thermogravime...

Atomic Force Microscopy (AFM) is a near-field technique to generate high-resolution images of surfaces. A micro-fabricated elastic beam with an integrated sharp sensor tip at its end is scanned over the sample surface. With various dynamic modes, leading to Force Modulation Microscopy [1], Ultrasonic Force Microscopy [2], Atomic Force Acoustic Microscopy (AFAM) [3–5], Microdeformation Microscop...

Scanning probe microscopy has been widely used to investigate various interactions in microscopic nature. Particularly, conductive atomic force microscopy (C-AFM) can provide local electronic signals conveniently, but the probe resolution of C-AFM has been limited by the tip geometry. Here, we improve the probe resolution greatly by forming an atomic-size metallic filament on a commercial C-AFM...

We report surface microscopy characterizations of large size graphene films (up to mm) grown on polycrystalline Ni foils and transferred to Si/SiO2. Wrinkles in such films are studied by both atomic force microscopy (AFM) and scanning tunneling microscopy (STM). Local graphitic lattice structures of the films are imaged with atomic-resolution STM and compared with those of the highly ordered py...

The measurement of short-range forces with the atomic force microscope (AFM) typically requires implementation of dynamic techniques to maintain sensitivity and stability. While frequency modulation atomic force microscopy (FM-AFM) is used widely for high-resolution imaging and quantitative force measurements in vacuum, quantitative force measurements using FM-AFM in liquids have proven elusive...

The effects of near-surface processing on the properties of AlGaN/GaN heterostructures were studied, combining conventional electrical characterization on high-electron mobility transistors (HEMTs), with advanced characterization techniques with nanometer scale resolution, i.e., transmission electron microscopy, atomic force microscopy (AFM) and conductive atomic force microscopy (C-AFM). In pa...