Nanoscale science and technology has today mainly focused on the fabrication of nano devices. In this paper, we study the use of lithography process to build the desired nanostructures directly. Nanolithography on polymethylmethacrylate (PMMA) surface is carried out by using Atomic Force Microscope (AFM) equipped with silicon tip, in contact mode. The analysis of the results shows that the ...

A simple method has been employed to synthesize Copper and Copper oxide nanoparticles from Copper (II) succinate precursor by thermal decomposition method using oleylamine as a capping agent. The particles synthesized with oleylamine and triphenylphosphine were well dispersed nanoparticles obtained from X-ray Diffraction (XRD). The Synthesized copper nanoparticles were characterized by UV-Visib...

A simple method has been employed to synthesize Copper and Copper oxide nanoparticles from Copper (II) succinate precursor by thermal decomposition method using oleylamine as a capping agent. The particles synthesized with oleylamine and triphenylphosphine were well dispersed nanoparticles obtained from X-ray Diffraction (XRD). The Synthesized copper nanoparticles were characterized by UV-Visib...

The atomic force microscope (AFM) and its derivative technologies have heralded a new era in science and technology. AFM and related instruments were primarily designed by physicists. In recent years there is a substantial presence of engineers with controls and systems background who are contributing to AFM related technologies. This article provides a tutorial on the control and systems appro...

We present a custom-designed atomic force fluorescence microscope (AFFM), which can perform simultaneous optical and topographic measurements with single molecule sensitivity throughout the whole visible to near-infrared spectral region. Integration of atomic force microscopy (AFM) and confocal fluorescence microscopy combines the high-resolution topographical imaging of AFM with the reliable (...

We show a quantitative connection between Refractive Index Profiles (RIP) and measurements made by an Atomic Force Microscope (AFM). Germanium doped fibers were chemically etched in hydrofluoric acid solution (HF) and the wet etching characteristics of germanium were studied using an AFM. The AFM profiles were compared to both a concentration profile of the preform determined using a Scanning E...

Use of the atomic force microscope (AFM) in quantitative force measurements inherently requires a theoretical framework enabling conversion of the observed deflection properties of the cantilever to an interaction force. In this paper, the theoretical foundations of using frequency modulation atomic force microscopy (FM-AFM) in quantitative force measurements are examined and rigorously elucida...

We used an atomic force microscope (AFM) to image samples immersed in a fluid in order to study the dynamic behavior of the membranes of living cells. AFM images of cultured cells immersed in a buffer were obtained without any preliminary preparation. We observed surface changes and displacements which suggest that the cells were still alive during the measurements. Some membrane details imaged...

The first results obtained with a new stand-alone atomic force microscope (AFM) integrated with a standard Zeiss optical fluorescence microscope are presented. The optical microscope allows location and selection of objects to be imaged with the high-resolution AFM. Furthermore, the combined microscope enables a direct comparison between features observed in the fluorescence microscope and thos...

Three-dimensional atom probe tomography (APT) is successfully used to analyze the near-apex regions of an atomic force microscope (AFM) tip. Atom scale material structure and chemistry from APT analysis for standard silicon AFM tips and silicon AFM tips coated with a thin film of Cu is presented. Comparison of the thin film data with that observed using transmission electron microscopy indicate...