Synchrotrons can be used to generate X-rays in order to probe materials at the atomic level. One approach is to use X-ray diffraction (XRD) to do this. The data from an XRD experiment consists of a sequence of digital image files which for a single scan could consist of hundreds or even thousands of digital images. Existing analysis software processes these images individually sequentially and ...

Hydration and dehydration reaction processes of many organic and inorganic compounds accompany phase changes, and X-ray diffraction (XRD) is a very powerful technique for studying the reaction processes. Thermal analysis is another important technique often used to obtain information needed for understanding the reaction processes. Commercially available instruments for XRD and thermal analysis...

zns/glass thinlayer in high vacuum condition and $40$ degree‎ ‎deposition angle has been produced by resistance evaporated method ‎with $28$ nm thickness‎. ‎cabin deposition temperature zns layer was‎ ‎about $50c$ and substrates were kept at room temperature‎. ‎the atomic ‎force microscopy (afm) and xrd analyses are perfectly accomplished‎ ‎for this layer.‎‎‎

A deep machine-learning technique based on a convolutional neural network (CNN) is introduced. It has been used for the classification of powder X-ray diffraction (XRD) patterns in terms of crystal system, extinction group and space group. About 150 000 powder XRD patterns were collected and used as input for the CNN with no handcrafted engineering involved, and thereby an appropriate CNN archi...

A non-invasive XRD/XRF instrument for study of works of art has been developed jointly by the Getty Conservation Institute and inXitu Inc. (California). Many aspects of the instrument are based on technologies initially developed for NASA’s planetary XRD/XRF instrument CheMin and used in inXitu’s portable transmission XRD/XRF instrument (Terra). A new geometry was designed based on a reflection...

Since zeolites are notoriously difficult to prepare as large single crystals, structure determination usually relies on powder X-ray diffraction (XRD). However, structure solution (i.e., deriving an initial structural model) directly from powder XRD data is often very difficult due to the diffraction phase problem and the high degree of overlap between the individual reflections, particularly f...