نتایج جستجو برای: آنالیز ebsd

تعداد نتایج: 42641  

2013
Robert A. Schwarzer Johann Sukkau

Within the past decade Electron Backscatter Diffraction (EBSD) has experienced wide acceptance in metallurgical and geological labs. It is a Kikuchi diffraction device based on the SEM that enables individual grain orientations, local texture, point-to-point orientation correlations, and phases to be determined routinely at a sub-grain size level on the surfaces of bulk polycrystals while explo...

2014
Yongliang Shao Lei Zhang Xiaopeng Hao Yongzhong Wu Yuanbin Dai Yuan Tian Qin Huo

We report a method to obtain the stress of crystalline materials directly from lattice deformation by Hooke's law. The lattice deformation was calculated using the crystallographic orientations obtained from electron backscatter diffraction (EBSD) technology. The stress distribution over a large area was obtained efficiently and accurately using this method. Wurtzite structure gallium nitride (...

Journal: :Ultramicroscopy 2008
Aimo Winkelmann

We present a model which describes the appearance of excess and deficiency features in electron backscatter diffraction (EBSD) patterns and we show how to include this effect in many-beam dynamical simulations of EBSD. The excess and deficiency features appear naturally if we take into account the anisotropy of the internal source of inelastically scattered electrons which are subsequently scat...

2010
Nina V. Burbure Paul A. Salvador Gregory S. Rohrer

Titania films have been grown on polycrystalline BaTiO3 (BTO) substrates at 7001C by pulsed laser deposition. Electron backscatter diffraction (EBSD) was used to determine grain orientations in the substrate before growth, and the phase and orientation of the supported films after growth. All BaTiO3 grains within 261 of (001) were covered by anatase films with an orientation relationship of (00...

Journal: :Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2013
Jun-Yun Kang Seong-Jun Park Man-Been Moon

A quantitative and automated phase analysis of dual-phase (DP) steel using electron backscatter diffraction (EBSD) was attempted. A ferrite-martensite DP microstructure was produced by intercritical annealing and quenching. An EBSD map of the microstructure was obtained and post-processed for phase discrimination. Band slope (BS), which was a measure of pattern quality, exhibited much stronger ...

2011

To improve the material characteristics of singleand poly-crystals of pure copper, the respective relationships between crystallographic orientations and microstructures, and the bending and mechanical properties were examined. And texture distribution is also analyzed. A grain refinement procedure was performed to obtain a grained structure. Furthermore, some analytical results related to crys...

2013
L. Li

The aim of this paper is to present the advantages of using Digital Image Correlation (DIC) and Infrared Thermography (IRT) to investigate the thermomechanical behavior of aluminum at the scale of its microstructure. The study combines these complementary imaging techniques: Electron Backscatter Diffraction (EBSD) to characterise the microstructure of the sample, DIC to obtain strain fields and...

2016
Hao-Ting Shen Tiejun Meng Leonid A. Bendersky Andreas Jossen

The grain boundaries of three Laves phase-related body-center-cubic (bcc) solid-solution, metal hydride (MH) alloys with different phase abundances were closely examined by scanning electron microscopy (SEM), transmission electron microscopy (TEM), and more importantly, electron backscatter diffraction (EBSD) techniques. By using EBSD, we were able to identify the alignment of the crystallograp...

Journal: :Journal of microscopy 2011
I Weikusat D A M DE Winter G M Pennock M Hayles C T W M Schneijdenberg M R Drury

Naturally deformed ice contains subgrains with characteristic geometries that have recently been identified in etched surfaces using high-resolution light microscopy (LM). The probable slip systems responsible for these subgrain boundary types can be determined using electron backscattered diffraction (EBSD), providing the etch features imaged with reflected LM can be retained during EBSD data ...

Journal: :Microscopy and Microanalysis 2018

نمودار تعداد نتایج جستجو در هر سال

با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید