The effect of technology scaling (0.5–0.09 m) on single event upset (SEU) phenomena is investigated using full two-dimensional device simulation. The SEU reliability parameters, such as critical charge ( crit), feedback time ( fd) and linear energy transfer (LET), are estimated. For 0 18 m, the source node collects a significant fraction of radiation-induced charge resulting in an increase of L...

We develop a behavioral axiomatic characterization of Subjective Expected Utility (SEU) under risk aversion. Given is an individual agent’s behavior in the market: assume a finite collection of asset purchases with corresponding prices. We show that such behavior satisfies a “revealed preference axiom” if and only if there exists a SEU model (a subjective probability over states and a concave u...

In many decisions under uncertainty, technological constraints restrict both the acts which an agent can perform and the events which she can observe. To address such situations, we assume that the set of possible states of the world and the set of possible outcomes each have a topological structure. The only feasible acts are continuous functions from states to outcomes, and the only observabl...

We develop a behavioral axiomatic characterization of Subjective Expected Utility (SEU) under risk aversion. Given is an individual agent’s behavior in the market: assume a finite collection of asset purchases with corresponding prices. We show that such behavior satisfies a “revealed preference axiom” if and only if there exists a SEU model (a subjective probability over states and a concave u...

This paper reports three design improvements for CMOS latches hardened against single event upset (SEU) based on three memory cells appeared in recent years. The improvement drastically reduces static power dissipation, reduces the number of transistors required in the VLSI, especially when they are used in the Gate Array. The original cells and the new improved latches are compared. It is show...

We develop a behavioral axiomatic characterization of subjective expected utility (SEU) under risk aversion. Given is an individual agent’s behavior in the market: assume a finite collection of asset purchases with corresponding prices. We show that such behavior satisfies a “revealed preference axiom” if and only if there exists a SEU model (a subjective probability over states and a concave u...

during subsequent incubation in two experiments. Treatment groups had four replicate incubation trays of 150 eggs each. As expected, hatchability of fertile eggs declined with length of egg storage in both experiments (P<0.01). This was due to increases in both percentage early and late dead embryos in both experiments. Hatchability of fertile eggs was increased by SEU storage and turning durin...

The development of a practical magnetic tunneling junction (MTJ) ten years ago allowed the creation of a new class of non-volatile memories. This technology may offer superior resistance to total ionizing dose and virtually unlimited write endurance, making it more attractive than flash memories for space applications. Although a number of manufacturers are developing high-density bulk magnetic...

Understanding the SEU induced failure modes specific to the Virtex SRAM FPGA is needed to evaluate the applicability of various mitigation schemes since many mitigation approaches were originally intended for ASICs and may not be effective or efficient within FPGAs due to the unique failure modes and architectures found in SRAM-based FPGAs. Through this work, we have shown that SEUs in FPGAs’ p...

Carbon nano tube devices are considered as a better replacement for CMOS technology nowadays due to its decreased sizing and increased performance. Resistive open and bridging faults play vital role in the dynamic fault analysis. These faults are important since the number of interconnects have increased. In this study we discuss the effect of open and bridging defects along with the variation ...