نتایج جستجو برای: x ray spectrum
تعداد نتایج: 865194 فیلتر نتایج به سال:
Introduction: Crosstalk is a leakage of X-ray or light produced in a matrix of X-ray detectors or array of photodiodes in one element to other elements affecting on image contrast and spatial resolution. In this study, we assessed X-ray crosstalk in a computed tomography (CT) scanner with small detector elements to estimate the effect of various parameters such as X-ray tube voltage, detector e...
LSI +61 303 is one of the few X-ray binaries with Be star companion from which both radio and high-energy gamma-ray emission have been observed. We present XMM-Newton and INTEGRAL observations which reveal variability of the X-ray spectral index of the system. The X-ray spectrum is hard (photon index Γ ≃ 1.5) during the orbital phases of both high and low X-ray flux. However, the spectrum softe...
LSI +61 303 is one of the few X-ray binaries with Be star companion from which both radio and high-energy gamma-ray emission have been observed. We present XMM-Newton and INTEGRAL observations which reveal variability of the X-ray spectral index of the system. The X-ray spectrum is hard (photon index Γ ≃ 1.5) during the orbital phases of both high and low X-ray flux. However, the spectrum softe...
Single crystals of Ba1-xKxBiO3 compound for 0 < x <0.6 from insulator to superconducting region have been grown by electrochemical method. The crystals have been characterized by powder x-ray diffraction and Laue x-ray to determine the crystal structure, formed phases and potassium concentration. Inelastic x-ray scattering spectrum of the crystals has been studied to investigate the phonon pro...
Nano-crystalline particles of CeO2 have been synthesized by a low temperature chemical precipitation method. The precursor materials used in this research were Ce(NO3)3.6H2O, NaOH and diethylene glycol as surfactant. X-ray powder diffraction results showed that face centered cubic CeO2 nanoparticles with crystalline size in nanometer scale were formed. Scanning electron microscopy measurement s...
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