نتایج جستجو برای: wagon wheel reticle
تعداد نتایج: 15305 فیلتر نتایج به سال:
Wheels turning in the movies or in other forms of stroboscopic presentation often appear to be rotating backward. Remarkably, a similar illusion is also seen in continuous light. The occurrence of this perception in the absence of intermittent illumination suggests that we normally see motion, as in movies, by processing a series of visual episodes.
Abstract The dynamic model of fast freight wagon is established to study the effect key parameters on performance. In order reduce wheel-rail interactions, such as primary suspension stiffness, arm joint and stiffness anti-yaw damper are optimized. results indicate that above have an influence wagon’s Compared with simulation original parameters, vertical force reduced by 10%, lateral 42% 38% r...
Relationship between the rate of electrochemical formation of mesoporous Si and the crystallographic directions has been studied by local anodization of wafers through a mask having the form of narrow long wedges radiating from the center in all directions ('wagon-wheel' mask). The etching rates were found from the side etching under the thin transparent n-Si mask. On p+-substrates of various o...
We provide new yield-aware mask strategies to mitigate emerging variability and defectivity challenges. To address variability, we analyze critical dimension variability with respect to reticle size and its impact on parametric yield. With a cost model that incorporates mask, wafer, and processing cost, considering throughput, yield, and manufacturing volume, we assess various reticle strategie...
The wheel effect (also called the Wagon-wheel effect) is a well-known rotation illusion in which a rotating wheel, when displayed as individual frames, appears to rotate differently from its true rotation due to temporal aliasing. In this paper, we propose several approaches to solve this problem for synthetic imagery in computer animation. First, we develop an algorithm to compute the frame nu...
In this paper, we provide new yield-aware mask strategies to mitigate emerging variability and defectivity challenges. To address variability, we analyze CD variability with respect to reticle size, and its impact on parametric yield. With a cost model that incorporates mask, wafer, and processing cost considering throughput, yield, and manufacturing volume, we assess various reticle strategies...
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