نتایج جستجو برای: transmission electron microscope tem

تعداد نتایج: 567607  

2015
Roy H. Geiss

Transmission electron backscattered diffraction, t-EBSD, in the scanning electron microscope, SEM, was initially described in 2010 [1]. After slow initial acceptance, the number of publications in which it is used is increasing markedly. Many of the first applications took advantage of the higher resolution of t-EBSD in the study of thin films [2], [3]. More recently it is being used for pre-sc...

Journal: :Nanotechnology 2011
Yang Lu Cheng Peng Yogeeswaran Ganesan Jian Yu Huang Jun Lou

In this paper, we have demonstrated the usage of a novel micro-mechanical device (MMD) to perform quantitative in situ tensile tests on individual metallic nanowires inside a transmission electron microscope (TEM). Our preliminary experiment on a 360 nm diameter nickel nanowire showed that the sample fractured at an engineering stress of ∼ 1.2 GPa and an engineering strain of ∼ 4%, which is con...

2014
Ken Harada Hiroto Kasai

One of the long standing problems affecting electron holography, such as lateral coherence limitation, has been solved by the split illumination method with a specially customized transmission electron microscope (TEM). The customized TEM has single [1] or double [2] biprisms in a condenser optical system. Conventional TEM, constructed for electron holography, however, does not have any biprism...

2015
Sabpreet Bhatti Sujas Bhardwaj Sachin Surve V. N. Shukla

Zinc Oxide doped with chromium and cobalt, in form of powder with nanometer size has been prepared by typical solgel route, with assistance of microwave radiations. The as prepared material’s structure was characterized under XRays Diffraction(XRD) and Scherrer formula was used to find the crystal size. The materials also have been characterized under Scanning Electron Microscope(SEM) and Trans...

Journal: :international journal of nanoscience and nanotechnology 2008
b. sadeghi m. a. s. sadjadi a. pourahmad

in this study silver/poly vinyl alcohol (pva) and silver/poly vinyl pyrrolidone (pvp) nanocomposites were prepared via reduction of silver salt by employing dmf (n, n`- dimethyl formamide) as a reducing agent. effects of protective agents such as pva and pvp were also described here. we show that the acidic ph of pvp solution also affects the interaction between protective agents and silver nan...

2008
L. Shi S. Gunasekaran

Pectin–ZnO nanocomposite was prepared in the aqueous solution condition at room temperature. The Fourier transform infrared, X-ray diffraction, and transmission electron microscope (TEM) measurements confirmed the nanoscaled structure of pectin–ZnO composite. According to the TEM observation, the average composite granules size was about 150 nm and the embedded ZnO nanoparticles were uniform wi...

2008
L Shi S Gunasekaran

Pectin-ZnO nanocomposite was prepared in the aqueous solution condition at room temperature. The Fourier transform infrared, X-ray diffraction, and transmission electron microscope (TEM) measurements confirmed the nanoscaled structure of pectin-ZnO composite. According to the TEM observation, the average composite granules size was about 150 nm and the embedded ZnO nanoparticles were uniform wi...

2017
Lan Hu

Electron microscopes have been widely used to investigate cell structures under high resolution. A scanning electron microscope (SEM) provides tridimensional images of a cell surface, while a transmission electron microscope (TEM) is commonly employed to observe the internal structure changes of host cells after bacterial adherence and invasion. The SEM and TEM can reveal bacterial location, bi...

2007
Hongbao Ma

Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are widely used in material science, metallurgy sicence and life science researches. TEM is an imaging technique where a beam of electrons is focused onto a specimen causing an enlarged version to appear on a fluorescent screen or layer of photographic film. SEM is a technique of electron microscope to produce high re...

2012
R. Collins

Scattering experiments in the transmission electron microscope (TEM) result in a large number of phase-identification challenges. This note is first in a series on the inverse-problems associated with Bayesian model-selection and parameter-estimation [1] from TEM data. In particular here we present a fast method for determining two g-vectors and an inter-spot angle from your diffraction and HRE...

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