In this paper the simulation and design of a quantum-film electro-optic switch is considered. This photonic device, is made from a new organic dipolar material called MNA or 2-methyl-4 nitroaniline, which possesses a high merit in comparison with it's inorganic counterparts (e.g. LiNbO3, GaAs, InSb, Quartz, etc). Montecarlo method is used to simulate the photon-it-electron interaction in this m...

We report the growth and characterization of Cu nanoparticles thin film of on glass substrate by pulse laser deposition method. The Cu thin film prepared with different energy 50, 60, 70, and 80 mJ. The energy effect on the morphological, structural and optical properties were studied by AFM, XRD and UV-Visible spectrophotometer. Surface topography studied by atomic force microscopy revealed na...

Terabit all-optical complementary logic is proposed using two successive time slots to represent a unique logical status. An organic molecular thin film is used as an array of optically controlled optical switches. By utilizing the planar structure of the film and its ultrafast optical response, proof-of-principle fully optical NOT and AND logic operations were demonstrated with 400-fs interval...

It is necessary to study the optical properties of thin films to fabricate optoelectronic and interference devices. One of the methods in thin film preparation is the spray pyrolysis technique, which involves many technical aspects for the preparation of uniform coating. In the present study, Nickel Oxide (NiO) thin film is prepared by spray pyrolysis technique. NiO thin film was deposited usin...

we report the growth and characterization of cu nanoparticles thin film of on glass substrate by pulse laser deposition method. the cu thin film prepared with different energy 50, 60, 70, and 80 mj. the energy effect on the morphological, structural and optical properties were studied by afm, xrd and uv-visible spectrophotometer. surface topography studied by atomic force microscopy revealed na...

An optical method to determine the nanostructure and the morphology of porous thin films is presented. This procedure is based on the response of a side-polished optical fiber with the film under study, when an adsorption-desorption cycle is carried out. Spectroscopic ellipsometry provides additional information about the optical properties and adsorption behavior of the film. Pore size distrib...

Optical constants (n and k) of Co20Fe60B20 (CoFeB) thin films (2~40nm) are measured by using interference enhancement method with spectroscopic ellipsometry in the wavelength range of 270~1600nm. The effects of film thickness, protection layer and annealing process on the optical constant of CoFeB film are investigated. In the range of 40~10nm, both n and k decrease with the decrease of thickne...

Optical diagnostics are used to probe the plasma or neutral gas above the substrate, particles in the gas or on the surface, the film surface and reactor walls, the film itself, and the substrate during thin film processing. The development and application of optical probes are highlighted, in particular for analyzing plasma/gas phase intermediates and products and film composition, and perform...