For semiconductor technologies, achievement of their ultimate potential depends greatly upon the ability to fully harness and exploit their advanced properties, which in turn depends on understanding these properties and their limiters. As such, the detailed characterization and analysis of advanced semiconductor materials and structures is paramount for the elucidation of these fundamental str...

This article reports the microstructural characteristics of various petroleum and pitch based nuclear graphites (IG-110, NBG-18, and PCEA) that are of interest to the next generation nuclear plant program. Bright-field transmission electron microscopy imaging was used to identify and understand the different features constituting the microstructure of nuclear graphite such as the filler particl...

ZnO is a strategic material for various photonic applications. We present our results on characterization of thin films of ZnO grown by sol-gel spin and RF sputtering methods. The characterization techniques involved ellipsometry, scanning electron microscopy with energy dispersive analysis, X-ray diffraction and scanning tunneling microscopy. Microstructural characterization of the films using...