نتایج جستجو برای: interface surface

تعداد نتایج: 818616  

Journal: :Journal of the Surface Finishing Society of Japan 1989

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه صنعتی اصفهان - دانشکده مهندسی مکانیک 1387

در این پایان نامه هدف شبیه سازی عددی حرکت و تغییر شکل قطره بر روی سطح و بررسی مدل های کشش می باشد. مطالعه در مورد قطرات در علوم و مهندسی دارای کاربرد و اهمیت زیادی است. یکی از این مسایل وجود قطرات بر روی سطح کاتدی در پیل های سوختی دارای غشاء مبادله کننده ی پروتون می باشد. در این پیل های سوختی مدیریت آب اهمیت ویژه ای دارد و وجود قطرات آب باعث کاهش عملکرد پیل سوختی می شود. بنابراین با استفاده از ...

Resonances are intrinsic characteristics of an elastic object, which are completely independent of the source of excitation. The appropriate utilization of the information contained within the resonance spectra and the identification of the resonance frequencies of the object can be used as a potent tool for material characterization. In this paper, a new mathematical model for the wave diffrac...

Scanning Impedance Microscopy (SIM) is one of the novel scanning probe microscopy (SPM) techniques, which has been developed to taking image from sample surface, providing quantitative information with high lateral resolution on the interface capacitance, and investigating the local capacitance–voltage (C–V) behavior of the interface and AC transport properties. The SIM is an ordinary AFM equip...

H. Bashiri, S. Eris

Isotherm equation is one of the important scientific bases for adsorbent selection. There are different isotherms that do not account for an adsorbate, different chemisorption geometries on the nanoporous surface. It is interesting to introduce a general isotherm, which considers different chemisorption geometries of an adsorbate on nanoporous surfaces. In this study, an isotherm for non-dissoci...

Scanning Impedance Microscopy (SIM) is one of the novel scanning probe microscopy (SPM) techniques, which has been developed to taking image from sample surface, providing quantitative information with high lateral resolution on the interface capacitance, and investigating the local capacitance–voltage (C–V) behavior of the interface and AC transport properties. The SIM is an ordinary AFM equip...

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