The Georgia Tech team developed state-of-the-art GaN heterojunction bipolar transistor (HBT) technology in this NSF program. Throughout the project period, baseline device fabrication and material growth techniques were actively studied and significant technological advancement was achieved in III-Nitride (III-N) HBT research. We successfully demonstrated high-current gain (> 100) InGaN HBT on ...

The effects of Shockley–Read–Hall, Auger, radiative, and intrinsic surface base recombination processes in the emitter-base space-charge region on the current gain of Pnp AlGaAs/GaAs heterojunction bipolar transistors are analyzed. At low forward emitter-base bias, the current gain of a typical Pnp AlGaAs/GaAs heterojunction bipolar transistor is shown to be reduced substantially below its valu...

We demonstrate multi-emitter Si/GexSi1 x npn heterojunction bipolar transistors (HBT’s) which require no base contact for transistor operation. The base current is supplied by the additional emitter contact under reverse bias due to the heavy doping of the emitter-base junction. Large-area HBT test structures exhibit good transistor characteristics, with current gain 400 regardless of whether t...

In this work, we demonstrate that the incorporation of carbon in the base of a npn Si/SiGe/Si heterojunction bipolar transistor dramatically reduces the outdiffusion of boron from the base under postgrowth implantation and annealing procedures. Without the addition of C, these processes would lead to transistors with vastly degraded transistor characteristics. This reduction in B diffusion, whe...

We present a parallel-in-waveform simulation technique for high frequency heterojunction bipolar transistor (HBT) circuit characterization. On the contrary to the conventional frequency domain analysis, the HBT circuit equations are solved with waveform relaxation and monotone iterative methods in large signal time domain. This approach has been applied to calculate HBT circuit RF output power,...

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