Damage introduced by dynamic secondary ion mass spectrometry ~SIMS! depth profiling is studied. A silicon sample with a boron marker layer was depth profiled by dynamic SIMS. After subsequent annealing at 750 °C for 30 min, the SIMS sample was reanalyzed by plan-view transmission electron microscope ~PTEM! and SIMS. PTEM images showed the presence of interstitial defects near the original SIMS ...

This article is a concise review of the application of secondary ion mass spectrometry (SIMS) to the imaging of biological cells. The paper covers the various advantages and disadvantages of different approaches to SIMS analysis with respect to the information that can be gained from the interrogation of the cells. Current successes, pitfalls and future potential for SIMS in cell imaging are di...

Many service identification methods (SIMs) have been proposed to support the determination of services that are appropriate for use in an SOA. However, these SIMs vary in terms of analysis objectives, identification procedures and service hierarchies. Due to the heterogeneity of the SIMs, practitioners often face the difficulty of choosing a SIM that copes with available resources and fits thei...

The purpose of the present research was to develop and validate a situational (or state) measure of motivation, the Situational Motivation Scale (SIMS). The SIMS is designed to assess the constructs of intrinsic motivation, identified regulation, external regulation, and amotivation (E. L. Deci & R. M. Ryan, 1985, 1991) in field and laboratory settings. Five studies were conducted to develop an...

We tested the suitability of two spectroscopic methods, x-ray photoelectron spectroscopy (XPS) and time of flight secondary ion mass spectrometry (ToF-SIMS), in the recognition of bacterial and eukaryotic cell footprints on implant surfaces. Human mesenchymal stem cells (MSCs) and Staphylococcus aureus were cultured on sample surfaces and detached using trypsin. Scanning electron microscopy con...

Different modes of SIMS for thin film analysis and the principle of SIMS will be discussed; this will be followed by a discussion of some features related to instrumentation: types of ion sources and their characteristics; ion microprobe versus ion microscope; special modes of SIMS: sputter neutral mass spectrometry (SNMS) and fast atom bombardment. (FAB). The discussion of analytical features ...

this article deals with the social and family values in one of the most famous simulation games (the sims) in the recent years. it is tried to answer some questions, whether, the sims is a representative of social values of american society, and in particular, of the american family. what is the cement of the american society from the game point of view? what does the sims family suggest as a m...

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