This paper discusses the fault features selection using principal component analysis and using multi-class support vector machine (MSVM) for bearing faults classification. The bearings vibration signal is obtained from experiment in accordance with the following conditions: normal bearing, bearing with inner race fault, bearing with outer race fault and bearings with balls fault. Statistical pa...

A nalog circuit implementations of fuzzy logic are characterized by performing logical connectives of analog signals. They can be considered as generalization of digital circuits to a range of logical values, thus forming a special class of analog circuits. The idea of this work is to exploit this relationship for testing. For fault modeling the behavior of faulty fuzzy gates is investigated th...

We propose an optimal convergence function for achieving fault-tolerant, internal clock synchroniza, tion in the presence of arbitrary process and clock failures. The diflerential fault-tolerant midpoint convergence function guarantees an optimal maximum correction, an optimal maximum drift rate, and an optimal maximum deviation. The proposed convergence function is simple and easy to compute. ...

In this paper, we evaluate the eeectiveness of the buuer-oriented microarchitecture validation methodology 1, 4, 5]. A list of design faults suggested by our industrial collaborator 2, 3] is used and investigated to determine if they can be detected by our generated validation sequences. Two metrics are used to determine the detection of the design faults: Functional deviation (f) is deened as ...

in this paper, a fault diagnosis system based on discrete wavelet transform (dwt) and artificial neural networks (anns) is designed to diagnose different types of fault in gears. dwt is an advanced signal-processing technique for fault detection and identification. five features of wavelet transform rms, crest factor, kurtosis, standard deviation and skewness of discrete wavelet coefficients of...

This paper presents a new model for evaluating the Defect Level, DL, in VLSI circuits as a function of the yield, Y , and the stuck-at fault coverage, T. It is shown that the observed DL(T) curve can be accurately modeled using non equally probable, realistic faults predicted from defect statistics data and IC layout. The deviation of DL(T) from the one estimated by the Williams-Brown equation ...

Model-based fault isolation and identification in hybrid systems is computationally expensive or even unfeasible for complex systems due to the presence of uncertainty concerning the actual state, and also due to the presence of both discrete and parametric faults coupled with changing modes in the system. In this work we improve fault isolation and identification performance for hybrid systems...

This paper addresses the problem of diagnosis of flash ADC’s and proposes a fault diagnosis technique which employs the Differential NonLinearity (DNL) test data for fault location and identification of the analog components in the converter. In the flash ADC, a fault causes deviation of DNL data from the ideal one. Hence, DNL data can be considered as a functional signature of the ADC. This pr...

Problem statement: The identification of faults in any analog circuit is highly required to ensure the reliability of the circuit. Early detection of faults in a circuit can greatly assist in maintenance of the system by avoiding possibly harmful damage borne out of the fault. Approach: A novel method for establishing a fault dictionary using Wavelet transform is presented. The Circuit Under Te...