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nanoscale science and technology has today mainly focused on the fabrication of nano devices. in this paper, we study the use of lithography process to build the desired nanostructures directly. nanolithography on polymethylmethacrylate (pmma) surface is carried out by using atomic force microscope (afm) equipped with silicon tip, in contact mode. the analysis of the results shows that the dept...

according to recent achievements in nano technology we can see its effects in different engineering fields. in nano manufacture process the first essential step is modeling coordinately in order to make it available different software are developing for this propose.  in this paper nano modeling for two papers is developed first understanding structure in nano and micro size and second simulati...

A new in-process atomic-force microscopy (AFM) based inspection is presented for nanolithography to compensate for any deviation such as instantaneous degradation of the lithography probe tip. Traditional method used the AFM probes for lithography work and retract to inspect the obtained feature but this practice degrades the probe tip shape and hence, affects the measurement quality. This pape...

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Nowadays, atomic-force microscopy plays a significant role in nanoscience and nanotechnology, and is widely used for direct measurement at atomic scale and scanning the sample surfaces. In tapping mode, the microcantilever of atomic-force microscope is excited at resonance frequency. Therefore, it is important to study its resonance. Moreover, atomic-force microscopes can be operated in fluid e...

Recently developed adhesion atomic force microscopy was used as a technique to map the spatial arrangement of chemical functional groups at a surface with a lateral resolution of 20 nm. The ratio of the adhesion forces for different functional groups can be compared with values determined from the known surface energies. This concept was demonstrated by mapping the adhesive interaction of domai...

A method for sensing the dissipation occurring when a sharp atomic force microscopy (AFM) tip is oscillated laterally above a surface at distances typical of non-contact mode AFM operation is established and demonstrated. Dissipation is detected by measuring the damping of lateral resonant modes of the AFM cantilever, excited independently after the lateral resonant mode identification, when th...